Inventor · disambiguated record
Tanya Nigam
Also filed as: NIGAM TANYA
13 granted patents·2 pending applications·138 citations·filing 2006–2017
92Inventor score
Top patents by PatentIndex Score
15 records- 0194US10126354B1Assessment of HCI in logic circuits based on AC stress in discrete FETsGLOBALFOUNDRIES INC·Filed 2017·Granted Nov 13, 2018·15 cites·20 claims
- 0291US8212315B2Integrated circuit with a laterally diffused metal oxide semiconductor device and method of forming the sameLOTFI ASHRAF W·Filed 2009·Granted Jul 3, 2012·23 cites·20 claims
- 0390US8253196B2Integrated circuit with a laterally diffused metal oxide semiconductor device and method of forming the sameLOTFI ASHRAF W·Filed 2009·Granted Aug 28, 2012·15 cites·20 claims
- 0490US8253197B2Integrated circuit with a laterally diffused metal oxide semiconductor device and method of forming the sameLOTFI ASHRAF W·Filed 2009·Granted Aug 28, 2012·19 cites·20 claims
- 0589US8987815B2Integrated circuit with a laterally diffused metal oxide semiconductor device and method of forming the sameENPIRION INC·Filed 2014·Granted Mar 24, 2015·8 cites·20 claims
- 0688US8633540B2Integrated circuit with a laterally diffused metal oxide semiconductor device and method of forming the sameLOTFI ASHRAF W·Filed 2012·Granted Jan 21, 2014·8 cites·19 claims
- 0787US8253195B2Integrated circuit with a laterally diffused metal oxide semiconductor device and method of forming the sameLOTFI ASHRAF W·Filed 2009·Granted Aug 28, 2012·14 cites·20 claims
- 0884US8610188B2Integrated circuit decoupling capacitor arrangementKERBER ANDREAS·Filed 2011·Granted Dec 17, 2013·13 cites·10 claims
- 0984US8212317B2Integrated circuit with a laterally diffused metal oxide semiconductor device and method of forming the sameLOTFI ASHRAF W·Filed 2009·Granted Jul 3, 2012·11 cites·20 claims
- 1084US8212316B2Integrated circuit with a laterally diffused metal oxide semiconductor device and method of forming the sameLOTFI ASHRAF W·Filed 2009·Granted Jul 3, 2012·11 cites·20 claims
- 1152US8817570B2Devices having bias temperature instability compensationMCMAHON WILLIAM·Filed 2012·Granted Aug 26, 2014·1 cites·18 claims
- 1245US2014110772A1Integrated circuit decoupling capacitor arrangementGLOBALFOUNDRIES INC·Filed 2013·Application pending·0 cites
- 1343US8241986B2Semiconductor device and process for reducing damaging breakdown in gate dielectricsKOOK TAEHO·Filed 2011·Granted Aug 14, 2012·0 cites·8 claims
- 1442US8089130B2Semiconductor device and process for reducing damaging breakdown in gate dielectricsKOOK TAEHO·Filed 2006·Granted Jan 3, 2012·0 cites·10 claims
- 1538US2013033285A1Methods for reliability testing of semiconductor devicesGLOBALFOUNDRIES INC·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →