Inventor · disambiguated record
Takeo Oomori
Also filed as: OOMORI TAKEO
20 granted patents·4 pending applications·172 citations·filing 2001–2015
94Inventor score
Top patents by PatentIndex Score
24 records- 0190US7298471B2Surface inspection apparatus and surface inspection methodNIKON CORP·Filed 2006·Granted Nov 20, 2007·12 cites·14 claims
- 0289US7643137B2Defect inspection apparatus, defect inspection method and method of inspecting hole patternNIKON CORP·Filed 2005·Granted Jan 5, 2010·15 cites·8 claims
- 0386US7369224B2Surface inspection apparatus, surface inspection method and exposure systemNIKON CORP·Filed 2005·Granted May 6, 2008·13 cites·23 claims
- 0484US7372557B2Surface defect inspection apparatus and surface defect inspection methodNIKON CORP·Filed 2006·Granted May 13, 2008·9 cites·23 claims
- 0582US7692780B2Surface inspecting apparatusNIKON CORP·Filed 2008·Granted Apr 6, 2010·8 cites·11 claims
- 0682US6693293B2Surface inspection apparatus using radiation or lightNIKON CORP·Filed 2001·Granted Feb 17, 2004·22 cites·10 claims
- 0780US6563577B2Defect testing apparatus and defect testing methodNIKON CORP·Filed 2001·Granted May 13, 2003·19 cites·14 claims
- 0879US6774987B2Surface inspection method, surface inspection apparatus, and recording medium and data signal for providing surface inspection programNIKON CORP·Filed 2003·Granted Aug 10, 2004·23 cites·16 claims
- 0977US8446578B2Defect inspection apparatus, defect inspection method and method of inspecting hole patternSUGIHARA MARI·Filed 2009·Granted May 21, 2013·5 cites·7 claims
- 1077US7557912B2Defect inspection apparatus and defect inspection methodNIKON CORP·Filed 2008·Granted Jul 7, 2009·4 cites·15 claims
- 1176US6646735B2Surface inspection apparatus and surface inspection methodNIKON CORP·Filed 2001·Granted Nov 11, 2003·14 cites·26 claims
- 1275US7307725B2Surface inspection apparatus, polarization illuminating device and light-receiving deviceNIKON CORP·Filed 2005·Granted Dec 11, 2007·6 cites·20 claims
- 1372US6654113B2Surface inspection apparatusNIKON CORP·Filed 2001·Granted Nov 25, 2003·10 cites·11 claims
- 1471US7697139B2Surface inspection apparatusNIKON CORP·Filed 2008·Granted Apr 13, 2010·2 cites·9 claims
- 1571US6512579B2Defect inspection apparatusNIKON CORP·Filed 2001·Granted Jan 28, 2003·9 cites·11 claims
- 1669US8687182B2Surface inspection apparatus and surface inspection methodNIKON CORP·Filed 2012·Granted Apr 1, 2014·1 cites·17 claims
- 1756US7834993B2Surface inspection apparatus and surface inspection methodNIKON CORP·Filed 2007·Granted Nov 16, 2010·0 cites·29 claims
- 1853US7990535B2Surface state detecting apparatusNIKON CORP·Filed 2010·Granted Aug 2, 2011·0 cites·15 claims
- 1953US2006238754A1Defect inspection apparatus and defect inspection methodNIKON CORP·Filed 2006·Application pending·0 cites
- 2051US8441627B2Surface inspection apparatus and surface inspection methodFUKAZAWA KAZUHIKO·Filed 2010·Granted May 14, 2013·0 cites·14 claims
- 2145US2004239918A1Defect inspection apparatus, defect inspection method and method of inspecting hole patternNIKON CORP·Filed 2004·Application pending·0 cites
- 2244US2008246966A1Surface-Inspecting Apparatus and Surface-Inspecting MethodNIKON CORP·Filed 2006·Application pending·0 cites
- 2344US2003112428A1Method and apparatus for surface inspectionNIKON CORP·Filed 2002·Application pending·0 cites
- 2439US9708955B2Exhaust purifying deviceKOMATSU MFG CO LTD·Filed 2015·Granted Jul 18, 2017·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →