Inventor · disambiguated record
Taro Osabe
Also filed as: OSABE TARO
16 granted patents·10 pending applications·277 citations·filing 2001–2013
94Inventor score
Top patents by PatentIndex Score
26 records- 0197US9366735B2Optical pumping magnetometerHITACHI LTD·Filed 2013·Granted Jun 14, 2016·53 cites·4 claims
- 0293US6787835B2Semiconductor memoriesHITACHI LTD·Filed 2002·Granted Sep 7, 2004·63 cites·52 claims
- 0391US6949782B2Semiconductor memoriesHITACHI LTD·Filed 2004·Granted Sep 27, 2005·49 cites·17 claims
- 0489US10162021B2Magnetic field measurement deviceHITACHI LTD·Filed 2013·Granted Dec 25, 2018·8 cites·6 claims
- 0589US8401273B2Apparatus for evaluating degradation of pattern featuresMOMONOI YOSHINORI·Filed 2010·Granted Mar 19, 2013·20 cites·13 claims
- 0682US8278700B2Semiconductor deviceOSABE TARO·Filed 2011·Granted Oct 2, 2012·6 cites·4 claims
- 0781US7078762B2Semiconductor memory device and method for producing the sameRENESAS TECH CORP·Filed 2004·Granted Jul 18, 2006·23 cites·9 claims
- 0879US6849895B2Semiconductor non-volatile memoryHITACHI LTD·Filed 2001·Granted Feb 1, 2005·17 cites·4 claims
- 0976US7939879B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2007·Granted May 10, 2011·4 cites·8 claims
- 1075US7045854B2Non-volatile semiconductor memoryHITACHI LTD·Filed 2003·Granted May 16, 2006·19 cites·9 claims
- 1164US9310447B2Magnetic field measuring apparatus and method for manufacturing sameKAMADA YUDAI·Filed 2011·Granted Apr 12, 2016·2 cites·15 claims
- 1264US7294880B2Semiconductor non-volatile memory cell with a plurality of charge storage regionsHITACHI LTD·Filed 2004·Granted Nov 13, 2007·7 cites·5 claims
- 1356US7622766B2Semiconductor memory device and method for producing the sameRENESAS TECH CORP·Filed 2007·Granted Nov 24, 2009·0 cites·7 claims
- 1456US6815763B2Semiconductor memory element, semiconductor device and control method thereofHITACHI LTD·Filed 2002·Granted Nov 9, 2004·6 cites·13 claims
- 1549US2012319187A1Semiconductor deviceOSABE TARO·Filed 2012·Application pending·0 cites
- 1646US2005237786A1Semiconductor memoriesHITACHI LTD·Filed 2005·Application pending·0 cites
- 1744US2007257305A1Nonvolatile semiconductor memory device and manufacturing method thereofSASAGO YOSHITAKA·Filed 2007·Application pending·0 cites
- 1844US2011058410A1Semiconductor memory deviceHITACHI LTD·Filed 2009·Application pending·0 cites
- 1942US2016169989A1Magnetic field measuring apparatusHITACHI LTD·Filed 2013·Application pending·0 cites
- 2041US7238570B2Semiconductor memory device and method for producing the sameRENESAS TECH CORP·Filed 2005·Granted Jul 3, 2007·0 cites·3 claims
- 2140US7045853B2Semiconductor memory element, semiconductor device and control method thereofHITACHI LTD·Filed 2004·Granted May 16, 2006·0 cites·24 claims
- 2240US2014346515A1Semiconductor device and method for manufacturing semiconductor deviceHITACHI LTD·Filed 2012·Application pending·0 cites
- 2340US2007176219A1Semiconductor deviceRENESAS TECH CORP·Filed 2006·Application pending·0 cites
- 2439US2007205440A1Semiconductor device and method for producing the sameISHIGAKI TAKASHI·Filed 2006·Application pending·0 cites
- 2536US2013341745A1Magnetic Field Measurement ApparatusSUZUKI SEIICHI·Filed 2011·Application pending·0 cites
- 2633US2005173751A1Semiconductor memory deviceRENESAS TECH CORP·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →