Inventor · disambiguated record
Tatsuo Shiina
Also filed as: SHIINA TATSUO
3 granted patents·2 pending applications·27 citations·filing 2001–2008
70Inventor score
Top patents by PatentIndex Score
5 records- 0179US7416330B2Method and apparatus for measuring temperature of substrateITO MASAFUMI·Filed 2005·Granted Aug 26, 2008·8 cites·8 claims
- 0268US6576390B1Method of and apparatus for manufacturing instant photographic film unitsFUJI PHOTO FILM CO LTD·Filed 2001·Granted Jun 10, 2003·12 cites·9 claims
- 0360US7267150B2Method of and apparatus for manufacturing instant photographic film unitsFUJIFILM CORP·Filed 2003·Granted Sep 11, 2007·7 cites·13 claims
- 0447US2009051924A1Apparatus for measuring thickness of a substrateMASAFUMI ITO·Filed 2008·Application pending·0 cites
- 0543US2005259716A1Method and apparatus for measuring temperature of substrateTOKYO ELECTRON LTD·Filed 2004·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Tatsuo Shiina files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →