Inventor · disambiguated record
Takahiro Urano
Also filed as: URANO TAKAHIRO
14 granted patents·2 pending applications·47 citations·filing 2010–2020
88Inventor score
Top patents by PatentIndex Score
16 records- 0194US9778206B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 3, 2017·16 cites·8 claims
- 0287US10861145B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 8, 2020·4 cites·9 claims
- 0387US9075026B2Defect inspection device and defect inspection methodURANO TAKAHIRO·Filed 2010·Granted Jul 7, 2015·11 cites·20 claims
- 0483US11788973B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 17, 2023·2 cites·10 claims
- 0583US9865046B2Defect inspection method and defect inspection deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 9, 2018·7 cites·6 claims
- 0677US11981202B2Accelerator pedal deviceMIKUNI KOGYO KK·Filed 2020·Granted May 14, 2024·1 cites·10 claims
- 0774US12039716B2Defect inspection method and defect inspection deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 16, 2024·2 cites·8 claims
- 0870US8908172B2Defect inspection device and method of inspecting defectURANO TAKAHIRO·Filed 2011·Granted Dec 9, 2014·2 cites·12 claims
- 0967US10466181B2Flaw inspection device and flaw inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted Nov 5, 2019·1 cites·15 claims
- 1061US8737718B2Apparatus and method for inspecting defectSAKAI KAORU·Filed 2010·Granted May 27, 2014·1 cites·8 claims
- 1157US10816484B2Flaw inspection device and flaw inspection methodHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 27, 2020·0 cites·8 claims
- 1255US12235223B2Method for defect inspection, system, and computer-readable mediumHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 25, 2025·0 cites·7 claims
- 1345US11041815B2Inspection information generation device, inspection information generation method, and defect inspection deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Jun 22, 2021·0 cites·13 claims
- 1442US12112963B2Defect inspection apparatus and defect inspection programHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 8, 2024·0 cites·14 claims
- 1542US2013202188A1Defect inspection method, defect inspection apparatus, program product and output unitHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 1637US2013294677A1Defect inspection method and defect inspection deviceURANO TAKAHIRO·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →