Inventor · disambiguated record
Takehiro Yamaoka
Also filed as: YAMAOKA TAKEHIRO
5 granted patents·120 citations·filing 1988–2016
81Inventor score
Top patents by PatentIndex Score
5 records- 0193US4874460AMethod and apparatus for modifying patterned filmSEIKO INSTR INC·Filed 1988·Granted Oct 17, 1989·73 cites·7 claims
- 0273US9823208B2Method for measuring spreading resistance and spreading resistance microscopeHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Granted Nov 21, 2017·1 cites·6 claims
- 0369US6941798B2Scanning probe microscope and operation methodSII NANOTECHNOLOGY INC·Filed 2003·Granted Sep 13, 2005·18 cites·11 claims
- 0457US6596992B2Method of operating scanning probe microscopeSEIKO INSTR INC·Filed 2001·Granted Jul 22, 2003·12 cites·20 claims
- 0546US6405583B1Correlation sample for scanning probe microscope and method of processing the correlation sampleSEIKO INSTR INC·Filed 1999·Granted Jun 18, 2002·16 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →