Inventor · disambiguated record

Tal Yanai

Also filed as: YANAI TAL

2 granted patents·16 citations·filing 2014–2014

57Inventor score

Technology areasG06F

Files withCADENCE DESIGN SYSTEMS INC2

Top patents by PatentIndex Score

2 records

0178US9558307B1System and method for providing a scalable server-implemented regression query environment for remote testing and analysis of a chip-design modelCADENCE DESIGN SYSTEMS INC·Filed 2014·Granted Jan 31, 2017·12 cites·20 claims
0271US9348733B1Method and system for coverage determinationCADENCE DESIGN SYSTEMS INC·Filed 2014·Granted May 24, 2016·4 cites·14 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →