Inventor · disambiguated record
Takahiro Yasui
Also filed as: YASUI TAKAHIRO
10 granted patents·96 citations·filing 1999–2013
87Inventor score
Top patents by PatentIndex Score
10 records- 0175US6594788B1Method of analyzing a relief of failure cell in a memory and memory testing apparatus having a failure relief analyzer using the methodADVANTEST CORP·Filed 2000·Granted Jul 15, 2003·26 cites·9 claims
- 0271US6711705B1Method of analyzing a relief of failure cell in a memory and memory testing apparatus having a failure relief analyzer using the methodADVANTEST CORP·Filed 2000·Granted Mar 23, 2004·22 cites·5 claims
- 0367US6425095B1Memory testing apparatusADVANTEST CORP·Filed 1999·Granted Jul 23, 2002·27 cites·5 claims
- 0466US9267965B2Flexible test site synchronizationADVANTEST CORP·Filed 2013·Granted Feb 23, 2016·2 cites·24 claims
- 0560US9960983B2Monitoring item selection method and device, and storage mediumHITACHI LTD·Filed 2013·Granted May 1, 2018·1 cites·8 claims
- 0658US6907385B2Memory defect redress analysis treating method, and memory testing apparatus performing the methodADVANTEST CORP·Filed 2001·Granted Jun 14, 2005·11 cites·9 claims
- 0754US8286045B2Test apparatus and test methodYASUI TAKAHIRO·Filed 2010·Granted Oct 9, 2012·2 cites·7 claims
- 0849US7265457B2Power control apparatusFURUKAWA ELECTRIC CO LTD·Filed 2004·Granted Sep 4, 2007·5 cites·4 claims
- 0934US8074134B2Pattern generator and memory testing device using the sameYASUI TAKAHIRO·Filed 2008·Granted Dec 6, 2011·0 cites·10 claims
- 1033US8423840B2Pattern generatorYASUI TAKAHIRO·Filed 2008·Granted Apr 16, 2013·0 cites·9 claims
Join the waitlist — get patent alerts
Get an alert when Takahiro Yasui files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →