Inventor · disambiguated record
Takafumi Yotsuji
Also filed as: YOTSUJI TAKAFUMI
6 granted patents·3 pending applications·29 citations·filing 1998–2016
76Inventor score
Top patents by PatentIndex Score
9 records- 0188US7863564B2Electric charged particle beam microscope and microscopyHITACHI HIGH TECH CORP·Filed 2008·Granted Jan 4, 2011·13 cites·7 claims
- 0267US6777679B2Method of observing a sample by a transmission electron microscopeHITACHI HIGH TECH CORP·Filed 2003·Granted Aug 17, 2004·10 cites·7 claims
- 0345US2017323762A1Charged particle beam apparatus, electron microscope and sample observation methodHITACHI HIGH TECH CORP·Filed 2014·Application pending·0 cites
- 0443US10535497B2Electron microscope and imaging methodHITACHI HIGH TECH CORP·Filed 2016·Granted Jan 14, 2020·0 cites·14 claims
- 0543US9754763B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 5, 2017·0 cites·5 claims
- 0639US9754762B2Electron microscope and sample observation methodHITACHI HIGH TECH CORP·Filed 2015·Granted Sep 5, 2017·0 cites·9 claims
- 0737US6472663B2Electron microscopeHITACHI LTD·Filed 1998·Granted Oct 29, 2002·6 cites·4 claims
- 0835US2012104253A1Charged particle beam microscope and measuring method using sameTSUNETA RURIKO·Filed 2010·Application pending·0 cites
- 0927US2013062519A1Electron microscope, and method for adjustng optical axis of electron microscopeOYAGI TOSHIYUKI·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Takafumi Yotsuji files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →