Inventor · disambiguated record
Tang Yu
Also filed as: YU TANG · Yu Tang Fei
9 granted patents·1 pending application·62 citations·filing 1998–2023
85Inventor score
Top patents by PatentIndex Score
10 records- 0187US9959586B1System, method, and computer program for encoding and decoding a unique signature in a video file as a set of watermarksGOANIMATE INC·Filed 2016·Granted May 1, 2018·15 cites·30 claims
- 0276US9813725B1System, method, and computer program for encoding and decoding a unique signature in a video fileGOANIMATE INC·Filed 2015·Granted Nov 7, 2017·6 cites·20 claims
- 0362US12142301B1System, method, and computer program for facilitating video generation by predicting and recommending next steps in the video generation processGOANIMATE INC·Filed 2023·Granted Nov 12, 2024·0 cites·24 claims
- 0454US6136613AMethod for recycling monitoring control wafersUNITED SILICON INC·Filed 1998·Granted Oct 24, 2000·22 cites·8 claims
- 0548US6383946B1Method of increasing selectivity in silicon nitride depositionUNITED MICROELECTRONICS CORP·Filed 2000·Granted May 7, 2002·3 cites·13 claims
- 0643US6245617B1Method of fabricating dielectric layerUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jun 12, 2001·11 cites·13 claims
- 0735US6566282B2Method of forming a silicon oxide layerUNITED MICROELECTRONICS CORP·Filed 2001·Granted May 20, 2003·0 cites·6 claims
- 0834US6046061AMethod of inspecting wafer water markUNITED SILICON INC·Filed 1998·Granted Apr 4, 2000·5 cites·18 claims
- 0932US2002076479A1Method of monitoring chemical vapor deposition conditionsUNITED MICROELECTRONICS CORP·Filed 2000·Application pending·0 cites
- 1022US6099902AMethod of determining a time to clean a low pressure chemical vapor deposition (LPCVD) systemUNITED SILICON INC·Filed 1998·Granted Aug 8, 2000·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →