Inventor · disambiguated record
Tetsuji Anai
Also filed as: ANAI TETSUJI
42 granted patents·2 pending applications·370 citations·filing 2006–2021
97Inventor score
Top patents by PatentIndex Score
44 records- 0196US7747151B2Image processing device and methodTOPCON CORP·Filed 2007·Granted Jun 29, 2010·54 cites·15 claims
- 0294US9897436B2Measuring instrument and surveying systemTOPCON CORP·Filed 2017·Granted Feb 20, 2018·8 cites·25 claims
- 0392US7860273B2Device and method for position measurementTOPCON CORP·Filed 2007·Granted Dec 28, 2010·36 cites·40 claims
- 0492US7844077B2Location measuring device and methodTOPCON CORP·Filed 2008·Granted Nov 30, 2010·25 cites·8 claims
- 0591US10520307B2Surveying instrumentTOPCON CORP·Filed 2017·Granted Dec 31, 2019·10 cites·7 claims
- 0689US10921430B2Surveying systemTOPCON CORP·Filed 2018·Granted Feb 16, 2021·8 cites·20 claims
- 0789US7860302B2Image processing apparatusTOPCON CORP·Filed 2008·Granted Dec 28, 2010·21 cites·20 claims
- 0888US11421989B2Surveying instrumentTOPCON CORP·Filed 2020·Granted Aug 23, 2022·2 cites·6 claims
- 0988US8953933B2Aerial photogrammetry and aerial photogrammetric systemTOPCON CORP·Filed 2013·Granted Feb 10, 2015·18 cites·9 claims
- 1087US9736360B2Survey data processing device, survey data processing method, and program thereforKK TOPCON·Filed 2016·Granted Aug 15, 2017·6 cites·8 claims
- 1187US9013576B2Aerial photograph image pickup method and aerial photograph image pickup apparatusOHTOMO FUMIO·Filed 2012·Granted Apr 21, 2015·12 cites·4 claims
- 1287US7860276B2Image processing device and methodTOPCON CORP·Filed 2006·Granted Dec 28, 2010·17 cites·13 claims
- 1385US11333496B2Surveying instrumentTOPCON CORP·Filed 2019·Granted May 17, 2022·5 cites·20 claims
- 1485US10281580B2Surveying systemTOPCON CORP·Filed 2016·Granted May 7, 2019·5 cites·20 claims
- 1585US7726033B2Multi-point measuring method and surveying deviceTOPCON CORP·Filed 2008·Granted Jun 1, 2010·19 cites·16 claims
- 1684US7747150B2Image processing device and methodTOPCON CORP·Filed 2007·Granted Jun 29, 2010·14 cites·10 claims
- 1781US9228858B2Rotation angle detecting apparatusTOPCON CORP·Filed 2014·Granted Jan 5, 2016·3 cites·5 claims
- 1881US9171225B2Device, method, and recording medium for detecting and removing mistracked points in visual odometry systemsTOPCON CORP·Filed 2013·Granted Oct 27, 2015·6 cites·4 claims
- 1980US8811718B2Position measurement method, position measurement device, and programANAI TETSUJI·Filed 2010·Granted Aug 19, 2014·9 cites·16 claims
- 2077US9158305B2Remote control systemOHTOMO FUMIO·Filed 2012·Granted Oct 13, 2015·7 cites·11 claims
- 2176US9409656B2Aerial photographing systemKK TOPCON·Filed 2014·Granted Aug 9, 2016·22 cites·6 claims
- 2276US8630755B2Automatic taking-off and landing systemOHTOMO FUMIO·Filed 2011·Granted Jan 14, 2014·24 cites·13 claims
- 2373US11193765B2Surveying instrument and photogrammetric methodTOPCON CORP·Filed 2019·Granted Dec 7, 2021·2 cites·20 claims
- 2473US9007461B2Aerial photograph image pickup method and aerial photograph image pickup apparatusTOPCON CORP·Filed 2012·Granted Apr 14, 2015·21 cites·10 claims
- 2571US10048063B2Measuring instrument and surveying systemTOPCON CORP·Filed 2018·Granted Aug 14, 2018·1 cites·10 claims
- 2670US11598637B2Surveying instrumentTOPCON CORP·Filed 2019·Granted Mar 7, 2023·1 cites·13 claims
- 2770US8836930B2Rotation angle detecting apparatus and surveying instrumentTOPCON CORP·Filed 2012·Granted Sep 16, 2014·3 cites·11 claims
- 2869US10198632B2Survey data processing device, survey data processing method, and survey data processing programTOPCON CORP·Filed 2016·Granted Feb 5, 2019·2 cites·7 claims
- 2968US9571794B2Surveying apparatusKK TOPCON·Filed 2012·Granted Feb 14, 2017·2 cites·8 claims
- 3067US8937278B2Rotation angle detecting apparatusTOPCON CORP·Filed 2013·Granted Jan 20, 2015·1 cites·8 claims
- 3166US9648304B2Image pickup method and photographing deviceKK TOPCON·Filed 2013·Granted May 9, 2017·2 cites·6 claims
- 3265US7787689B2Location measuring device and methodTOPCON CORP·Filed 2008·Granted Aug 31, 2010·3 cites·7 claims
- 3361US10331972B2Survey data processing device, survey data processing method, and program thereforKK TOPCON·Filed 2016·Granted Jun 25, 2019·1 cites·6 claims
- 3456US11630208B2Measurement system, measurement method, and measurement programTOPCON CORP·Filed 2020·Granted Apr 18, 2023·0 cites·14 claims
- 3556US11598874B2Surveying instrument and surveying instrument systemTOPCON CORP·Filed 2021·Granted Mar 7, 2023·0 cites·18 claims
- 3655US11512957B2Surveying instrumentTOPCON CORP·Filed 2020·Granted Nov 29, 2022·0 cites·10 claims
- 3755US2021382143A1Surveying Instrument And Surveying SystemTOPCON CORP·Filed 2021·Application pending·0 cites
- 3852US11293754B2Surveying instrumentTOPCON CORP·Filed 2020·Granted Apr 5, 2022·0 cites·6 claims
- 3952US11150346B2Measuring method and laser scannerTOPCON CORP·Filed 2017·Granted Oct 19, 2021·0 cites·13 claims
- 4050US2020318963A1Surveying InstrumentTOPCON CORP·Filed 2020·Application pending·0 cites
- 4149US11415414B2Surveying instrumentTOPCON CORP·Filed 2019·Granted Aug 16, 2022·0 cites·20 claims
- 4246US11402207B2Surveying instrumentTOPCON CORP·Filed 2018·Granted Aug 2, 2022·0 cites·6 claims
- 4345US9541382B2Rotation angle detecting apparatus and surveying instrumentKK TOPCON·Filed 2012·Granted Jan 10, 2017·0 cites·13 claims
- 4436US9911038B2Survey data processing device, survey data processing method, and program thereforKK TOPCON·Filed 2016·Granted Mar 6, 2018·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →