Inventor · disambiguated record
Terry Sinclair Connacher
Also filed as: CONNACHER TERRY SINCLAIR
10 granted patents·3 pending applications·48 citations·filing 2003–2025
87Inventor score
Technology areasG01R
Top patents by PatentIndex Score
13 records- 0196US11828796B1Integrated heater and temperature measurementAEM HOLDINGS LTD·Filed 2023·Granted Nov 28, 2023·8 cites·23 claims
- 0293US12061227B1Integrated heater and temperature measurementAEM SINGAPORE PTE LTD·Filed 2023·Granted Aug 13, 2024·1 cites·24 claims
- 0391US12085609B1Thermal control wafer with integrated heating-sensing elementsAEM SINGAPORE PTE LTD·Filed 2023·Granted Sep 10, 2024·1 cites·28 claims
- 0490US12013432B1Thermal control wafer with integrated heating-sensing elementsAEM SINGAPORE PTE LTD·Filed 2023·Granted Jun 18, 2024·1 cites·29 claims
- 0589US12000885B1Multiplexed thermal control wafer and coldplateAEM SINGAPORE PTE LTD·Filed 2023·Granted Jun 4, 2024·1 cites·29 claims
- 0683US2024369621A1Integrated heater and temperature measurementAEM SINGAPORE PTE LTD·Filed 2024·Application pending·0 cites
- 0780US12259428B1Multiplexed thermal control wafer and coldplateAEM SINGAPORE PTE LTD·Filed 2024·Granted Mar 25, 2025·0 cites·23 claims
- 0879US2025067797A1Thermal control wafer with integrated heating-sensing elementsAEM SINGAPORE PTE LTD·Filed 2024·Application pending·0 cites
- 0975US2025244380A1Multiplexed thermal control wafer and coldplateAEM SINGAPORE PTE LTD·Filed 2025·Application pending·0 cites
- 1069US6958617B1Electromechanical module, for holding IC-chips in a chip testing system, that synchronizes and translates test signals to the IC-chipsUNISYS CORP·Filed 2004·Granted Oct 25, 2005·14 cites·11 claims
- 1163US6924636B2System for testing one or more groups of IC-chips while concurrently loading/unloading another groupUNISYS CORP·Filed 2003·Granted Aug 2, 2005·11 cites·14 claims
- 1252US6919718B2System for testing a group of IC-chips having a chip holding subassembly that is built-in and loaded/unloaded automaticallyUNISYS CORP·Filed 2003·Granted Jul 19, 2005·6 cites·12 claims
- 1350US6909299B1System for testing multiple groups of IC-chips which concurrently sends time-shifted test signals to the groupsUNISYS CORP·Filed 2003·Granted Jun 21, 2005·5 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →