Inventor · disambiguated record
Tetsuya Kuitani
Also filed as: KUITANI TETSUYA
5 granted patents·1 pending application·16 citations·filing 2006–2015
74Inventor score
Top patents by PatentIndex Score
6 records- 0184US7764152B2Contactor, contact structure provided with contactors, probe card, test apparatus, method of production of contact structure, and production apparatus of contact structureADVANTEST CORP·Filed 2006·Granted Jul 27, 2010·8 cites·9 claims
- 0271US8241929B2Contactor, contact structure, probe card, and test apparatusKUITANI TETSUYA·Filed 2011·Granted Aug 14, 2012·2 cites·11 claims
- 0369US8097475B2Method of production of a contact structureKUITANI TETSUYA·Filed 2010·Granted Jan 17, 2012·2 cites·17 claims
- 0462US7474109B2Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatusADVANTEST CORP·Filed 2006·Granted Jan 6, 2009·4 cites·18 claims
- 0542US2012133383A1Probe, probe card and electronic device testing apparatusKUITANI TETSUYA·Filed 2009·Application pending·0 cites
- 0634US9684053B2Wafer for testing and a test systemADVANTEST CORP·Filed 2015·Granted Jun 20, 2017·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →