Inventor · disambiguated record
Tetsuo Tada
Also filed as: TADA TETSUO
14 granted patents·547 citations·filing 1983–1996
94Inventor score
Top patents by PatentIndex Score
14 records- 0196US4961052AProbing plate for wafer testingMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Oct 2, 1990·141 cites·8 claims
- 0288US5055780AProbe plate used for testing a semiconductor device, and a test apparatus thereforMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Oct 8, 1991·72 cites·7 claims
- 0386US5266894AApparatus and method for testing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Nov 30, 1993·55 cites·15 claims
- 0485US5042148AMethod of manufacturing a probing card for wafer testingMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Aug 27, 1991·47 cites·5 claims
- 0584US5436559AMethod for testing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Jul 25, 1995·45 cites·10 claims
- 0678US4799009ASemiconductor testing deviceVLSI TECHNOLOGY RES ASS·Filed 1983·Granted Jan 17, 1989·44 cites·2 claims
- 0777US4983908AProbing card for wafer testing and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Jan 8, 1991·34 cites·8 claims
- 0861US4807229ASemiconductor device testerMITSUBISHI ELECTRIC CORP·Filed 1987·Granted Feb 21, 1989·18 cites·6 claims
- 0960US4720671ASemiconductor device testing deviceMITSUBISHI ELECTRIC CORP·Filed 1985·Granted Jan 19, 1988·18 cites·4 claims
- 1059US5894172ASemiconductor device with identification functionMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Apr 13, 1999·26 cites·2 claims
- 1152US4801871ATesting apparatus for semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Jan 31, 1989·13 cites·10 claims
- 1251US4888715ASemiconductor test systemMITSUBISHI ELECTRIC CORP·Filed 1985·Granted Dec 19, 1989·18 cites·9 claims
- 1344US4813043ASemiconductor test deviceMITSUBISHI ELECTRIC CORP·Filed 1987·Granted Mar 14, 1989·12 cites·3 claims
- 1432US4873686ATest assist circuit for a semiconductor device providing fault isolationMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Oct 10, 1989·4 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →