Inventor · disambiguated record
Teruaki Tokutomi
Also filed as: TOKUTOMI TERUAKI
13 granted patents·7 pending applications·61 citations·filing 1996–2013
89Inventor score
Files withHITACHI HIGH TECH CORP11TOKUTOMI TERUAKI3NAKAGOMI TSUNEO2ZHANG KAIFENG2HITACHI ELECTR ENG1
Top patents by PatentIndex Score
20 records- 0191US7355393B2Magnetic head slider testing apparatus and magnetic head slider testing methodHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 8, 2008·15 cites·15 claims
- 0285US8359661B2Magnetic device inspection apparatus and magnetic device inspection methodHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 22, 2013·10 cites·18 claims
- 0381US8299784B2Device for transporting magnetic head, device for inspecting magnetic head, and method for manufacturing magnetic headTOKUTOMI TERUAKI·Filed 2010·Granted Oct 30, 2012·9 cites·8 claims
- 0465US7987583B2Magnetic head slider testing apparatus and magnetic head slider testing methodHITACHI HIGH TECH CORP·Filed 2008·Granted Aug 2, 2011·4 cites·7 claims
- 0561US6893329B2Polishing apparatus with abrasive tape, polishing method using abrasive tape and manufacturing method for magnetic diskHITACHI HIGH TECH ELECT ENG CO·Filed 2003·Granted May 17, 2005·10 cites·25 claims
- 0660US8787132B2Method and apparatus for inspecting thermal assist type magnetic headHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 22, 2014·1 cites·10 claims
- 0760US8713710B2Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatusHITACHI HIGH TECH CORP·Filed 2012·Granted Apr 29, 2014·1 cites·14 claims
- 0860US8483035B2Thermally assisted magnetic recording head inspection method and apparatusZHANG KAIFENG·Filed 2012·Granted Jul 9, 2013·1 cites·11 claims
- 0957US8278917B2Magnetic head inspection method and magnetic head inspection deviceNAKAGOMI TSUNEO·Filed 2009·Granted Oct 2, 2012·2 cites·5 claims
- 1056US8787134B2Thermally assisted magnetic recording head inspection method and apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 22, 2014·0 cites·10 claims
- 1148US2012324720A1Magnetic head manufacturing methodNAKAGOMI TSUNEO·Filed 2012·Application pending·0 cites
- 1245US2014096293A1Method and apparatus for inspecting thermal assist type magnetic headHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 1343US8621659B2Cantilever for magnetic force microscope and method of manufacturing the sameZHANG KAIFENG·Filed 2012·Granted Dec 31, 2013·0 cites·11 claims
- 1443US2014092717A1Method and apparatus for inspecting thermal assist type magnetic headHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 1542US2014086033A1Method and apparatus for inspecting thermal assist type magnetic head deviceHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 1641US8327525B2Magnetic head slider testing methodTOKUTOMI TERUAKI·Filed 2011·Granted Dec 11, 2012·0 cites·7 claims
- 1740US5757492AApparatus for measuring the flying height of magnetic heads using a single-crystal sapphire discHITACHI ELECTR ENG·Filed 1996·Granted May 26, 1998·8 cites·7 claims
- 1838US2014090117A1Magnetic head inspection system and magnetic head inspection methodHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 1938US2013133444A1Head element inspection apparatusHITACHI HIGH TECH CORP·Filed 2012·Application pending·0 cites
- 2030US2013063139A1Method and its apparatus for inspecting a magnetic head deviceTOKUTOMI TERUAKI·Filed 2012·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Teruaki Tokutomi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →