Inventor · disambiguated record
Te-Min Wang
Also filed as: WANG TE-MIN
3 granted patents·3 citations·filing 2017–2020
55Inventor score
Technology areasH10P
Files withADVANCED ION BEAM TECH INC3
Top patents by PatentIndex Score
3 records- 0173US10984524B2Calibration system with at least one camera and method thereofADVANCED ION BEAM TECH INC·Filed 2018·Granted Apr 20, 2021·2 cites·29 claims
- 0265US10804821B2Apparatus and method for monitoring the relative relationship between the wafer and the chuckADVANCED ION BEAM TECH INC·Filed 2017·Granted Oct 13, 2020·1 cites·6 claims
- 0358US11349414B2Apparatus and method for monitoring the relative relationship between the wafer and the chuckADVANCED ION BEAM TECH INC·Filed 2020·Granted May 31, 2022·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →