Inventor · disambiguated record
Te-Sheng Wang
Also filed as: WANG TE-SHENG
11 granted patents·6 pending applications·26 citations·filing 2002–2025
85Inventor score
Top patents by PatentIndex Score
17 records- 0190US10359705B2Indirect determination of a processing parameterASML NETHERLANDS BV·Filed 2016·Granted Jul 23, 2019·9 cites·20 claims
- 0289US10372043B2Hotspot aware dose correctionASML NETHERLANDS BV·Filed 2015·Granted Aug 6, 2019·4 cites·20 claims
- 0383US11029609B2Simulation-assisted alignment between metrology image and designASML NETHERLANDS BV·Filed 2017·Granted Jun 8, 2021·2 cites·20 claims
- 0482US12197134B2Apparatus and method for process-window characterizationASML NETHERLANDS BV·Filed 2022·Granted Jan 14, 2025·0 cites·20 claims
- 0581US11243473B2Measurement method and apparatusASML NETHERLANDS BV·Filed 2018·Granted Feb 8, 2022·2 cites·20 claims
- 0681US10852646B2Displacement based overlay or alignmentASML NETHERLANDS BV·Filed 2017·Granted Dec 1, 2020·2 cites·21 claims
- 0777US2025147428A1Apparatus and method for process-window characterizationASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0875US9166846B1Eye diagram construction display apparatusPHYTREX TECHNOLOGY CORP·Filed 2014·Granted Oct 20, 2015·7 cites·10 claims
- 0972US11592752B2Apparatus and method for process-window characterizationASML NETHERLANDS BV·Filed 2020·Granted Feb 28, 2023·0 cites·20 claims
- 1071US11669018B2Simulation-assisted alignment between metrology image and designASML NETHERLANDS BV·Filed 2021·Granted Jun 6, 2023·0 cites·24 claims
- 1160US10656531B2Apparatus and method for process-window characterizationASML NETHERLANDS BV·Filed 2016·Granted May 19, 2020·0 cites·21 claims
- 1256US2024355578A1Software, methods, and systems for determination of a local focus pointASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 1356US2024339295A1Method of generating a sample map, computer program product, charged particle inspection system, method of processing a sample, assessment methodASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 1451US12315175B2Method in the manufacturing process of a device, a non-transitory computer-readable medium and a system configured to perform the methodASML NETHERLANDS BV·Filed 2019·Granted May 27, 2025·0 cites·20 claims
- 1547US2023401727A1Simulation-assisted metrology image alignmentASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 1642US2003170345A1Structure of a tea bagFiled 2002·Application pending·0 cites
- 1735US2012075205A1Touch input device and power saving method thereofHUANG YU-REN·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →