Inventor · disambiguated record
Teresa J. Wu
Also filed as: WU TERESA J · WU TERESA JACQUELINE
10 granted patents·5 pending applications·83 citations·filing 1999–2024
86Inventor score
Files withIBM15
Top patents by PatentIndex Score
15 records- 0188US11458474B2Microfluidic chips with one or more viasIBM·Filed 2018·Granted Oct 4, 2022·3 cites·6 claims
- 0270US6703312B2Method of forming active devices of different gatelengths using lithographic printed gate images of same lengthIBM·Filed 2002·Granted Mar 9, 2004·16 cites·20 claims
- 0370US2022362774A1Microfluidic chips with one or more viasIBM·Filed 2022·Application pending·0 cites
- 0469US6294449B1Self-aligned contact for closely spaced transistorsIBM·Filed 1999·Granted Sep 25, 2001·37 cites·6 claims
- 0568US11652006B2FinFET complementary metal-oxide-semiconductor (CMOS) devicesIBM·Filed 2022·Granted May 16, 2023·0 cites·20 claims
- 0668US6429067B1Dual mask process for semiconductor devicesIBM·Filed 2001·Granted Aug 6, 2002·15 cites·10 claims
- 0764US12142599B2Stacked transistor structure with reflection layerIBM·Filed 2022·Granted Nov 12, 2024·0 cites·18 claims
- 0862US12349445B2Vertically integrated semiconductor deviceIBM·Filed 2022·Granted Jul 1, 2025·0 cites·18 claims
- 0962US6303275B1Method for resist filling and planarization of high aspect ratio featuresIBM·Filed 2000·Granted Oct 16, 2001·7 cites·20 claims
- 1060US11244872B2FinFET complementary metal-oxide-semiconductor (CMOS) devicesIBM·Filed 2020·Granted Feb 8, 2022·0 cites·15 claims
- 1156US2025380455A1Stacked field-effect transistors with asymmetric source/drain regionsIBM·Filed 2024·Application pending·0 cites
- 1255US2025294887A1Self-aligned isolation layer for stacked field-effect transistorsIBM·Filed 2024·Application pending·0 cites
- 1353US2024047525A1Co-integrating thin gate oxide and thick gate oxide nanosheet transistorsIBM·Filed 2022·Application pending·0 cites
- 1452US2025031440A1Multi-silicide stacked field-effect transistorsIBM·Filed 2023·Application pending·0 cites
- 1550US7111257B2Using a partial metal level mask for early test resultsIBM·Filed 2003·Granted Sep 19, 2006·5 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →