Inventor · disambiguated record
Thorsten Benter
Also filed as: BENTER THORSTEN
8 granted patents·3 pending applications·36 citations·filing 2003–2025
81Inventor score
Top patents by PatentIndex Score
11 records- 0190US9324548B1Method and device to increase the internal energy of ions in mass spectrometersBRUKER DALTONIK GMBH·Filed 2014·Granted Apr 26, 2016·26 cites·20 claims
- 0278US10236169B2Ionization device with mass spectrometer therewithZEISS CARL SMT GMBH·Filed 2017·Granted Mar 19, 2019·3 cites·20 claims
- 0372US11791147B2Mass spectrometer and method for analysing a gas by mass spectrometryLEYBOLD GMBH·Filed 2019·Granted Oct 17, 2023·2 cites·29 claims
- 0461US9228926B2Chemical ionization with reactant ion formation at atmospheric pressure in a mass spectrometerBRUKER DALTONIK GMBH·Filed 2014·Granted Jan 5, 2016·1 cites·20 claims
- 0557US8481927B2High yield atmospheric pressure ion source for ion spectrometers in vacuumFRANZEN JOCHEN·Filed 2010·Granted Jul 9, 2013·2 cites·16 claims
- 0651US12278100B2Holding device for at least one filament and mass spectrometerLEYBOLD GMBH·Filed 2020·Granted Apr 15, 2025·0 cites·17 claims
- 0751US12176199B2Ionization device and mass spectrometerLEYBOLD GMBH·Filed 2020·Granted Dec 24, 2024·0 cites·11 claims
- 0849US2025174452A1Residual gas analyser, projection exposure apparatus comprising a residual gas analyser and method of residual gas analysisZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0949US2025166983A1Residual gas analyser, projection exposure apparatus comprising a residual gas analyser and method of residual gas analysisZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 1046US6924480B2Apparatus and method for using a volume conductive electrode with ion optical elements for a time-of-flight mass spectrometerUNIV CALIFORNIA·Filed 2003·Granted Aug 2, 2005·2 cites·27 claims
- 1136US2008296485A1Method and Device for Mass Spectrometry Examination of AnalytesBRUKER DALTONIK GMBH·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →