Inventor · disambiguated record
Thiago Figueiro
Also filed as: FIGUEIRO THIAGO
8 granted patents·6 citations·filing 2012–2016
76Inventor score
Top patents by PatentIndex Score
8 records- 0173US10295912B2Method for determining the parameters of an IC manufacturing process modelASELTA NANOGRAPHICS·Filed 2015·Granted May 21, 2019·2 cites·15 claims
- 0265US10578978B2Method for determining the dose corrections to be applied to an IC manufacturing process by a matching procedureASELTA NANOGRAPHICS·Filed 2016·Granted Mar 3, 2020·1 cites·16 claims
- 0365US10156796B2Method for determining the parameters of an IC manufacturing process by a differential procedureASELTA NANOGRAPHICS·Filed 2015·Granted Dec 18, 2018·1 cites·23 claims
- 0463US9224577B2Method for correcting electronic proximity effects using off-center scattering functionsSCHIAVONE PATRICK·Filed 2012·Granted Dec 29, 2015·1 cites·12 claims
- 0561US10553394B2Method for the correction of electron proximity effectsASELTA NANOGRAPHICS·Filed 2014·Granted Feb 4, 2020·1 cites·14 claims
- 0640US9934336B2Method of correcting electron proximity effects using Voigt type scattering functionsASELTA NANOGRAPHICS·Filed 2013·Granted Apr 3, 2018·0 cites·14 claims
- 0738US10522328B2Method of performing dose modulation, in particular for electron beam lithographyASELTA NANOGRAPHICS·Filed 2016·Granted Dec 31, 2019·0 cites·16 claims
- 0838US10423074B2Method for calculating the metrics of an IC manufacturing processCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2015·Granted Sep 24, 2019·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →