Inventor · disambiguated record
Thomas Gentner
Also filed as: GENTNER THOMAS · GENTNER THOMAS F
17 granted patents·54 citations·filing 1996–2023
90Inventor score
Top patents by PatentIndex Score
17 records- 0193US10746790B1Constrained pseudorandom test pattern for in-system logic built-in self-testIBM·Filed 2019·Granted Aug 18, 2020·12 cites·20 claims
- 0286US9740813B1Layout effect characterization for integrated circuitsIBM·Filed 2016·Granted Aug 22, 2017·4 cites·15 claims
- 0378US12292472B2Testing a single chip in a wafer probing systemIBM·Filed 2023·Granted May 6, 2025·0 cites·23 claims
- 0470US11808808B2Testing a single chip in a wafer probing systemIBM·Filed 2021·Granted Nov 7, 2023·0 cites·25 claims
- 0569US9319030B2Integrated circuit failure prediction using clock duty cycle recording and analysisIBM·Filed 2013·Granted Apr 19, 2016·3 cites·19 claims
- 0661US10288684B2On-chip hardware-controlled window strobingIBM·Filed 2017·Granted May 14, 2019·0 cites·9 claims
- 0761US10281527B2On-chip hardware-controlled window strobingIBM·Filed 2017·Granted May 7, 2019·0 cites·16 claims
- 0861US5846583ATemperature sensing method and system for pasteurizationWELCH S FOODS INC·Filed 1997·Granted Dec 8, 1998·24 cites·17 claims
- 0958US10114914B2Layout effect characterization for integrated circuitsIBM·Filed 2017·Granted Oct 30, 2018·0 cites·15 claims
- 1058US9904748B1Layout effect characterization for integrated circuitsIBM·Filed 2017·Granted Feb 27, 2018·0 cites·14 claims
- 1154US9354275B2Testing an integrated circuitGLOBALFOUNDRIES INC·Filed 2014·Granted May 31, 2016·1 cites·20 claims
- 1250US11074147B2Continuous mutual extended processor self-testIBM·Filed 2018·Granted Jul 27, 2021·0 cites·14 claims
- 1348US10768232B2ATE compatible high-efficient functional testIBM·Filed 2017·Granted Sep 8, 2020·0 cites·17 claims
- 1447US11239152B2Integrated circuit with optical tunnelIBM·Filed 2019·Granted Feb 1, 2022·0 cites·11 claims
- 1546US10684930B2Functional testing of high-speed serial linksIBM·Filed 2017·Granted Jun 16, 2020·0 cites·20 claims
- 1643US11574695B1Logic built-in self-test of an electronic circuitIBM·Filed 2021·Granted Feb 7, 2023·0 cites·20 claims
- 1739US5704597ARadial bearing and trouble support having the radial bearingMETZELER GIMETALL AG·Filed 1996·Granted Jan 6, 1998·10 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →