Inventor · disambiguated record
Thomas Jarik Huisman
Also filed as: HUISMAN THOMAS JARIK
5 granted patents·9 pending applications·0 citations·filing 2018–2025
60Inventor score
Files withASML NETHERLANDS BV14
Top patents by PatentIndex Score
14 records- 0173US2025166960A1Sem image enhancement methods and systemsASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0265US2025306094A1Electrical connection testingASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0363US11733614B2Method of metrology and associated apparatusesASML NETHERLANDS BV·Filed 2021·Granted Aug 22, 2023·0 cites·18 claims
- 0458US11112703B2Method of metrology and associated apparatusesASML NETHERLANDS BV·Filed 2019·Granted Sep 7, 2021·0 cites·19 claims
- 0557US2025284209A1Method and system of overlay measurement using charged-particle inspection apparatusASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0655US2024297013A1Aligning a distorted imageASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0754US2025003899A1Method and system of image analysis and critical dimension matching for charged-particle inspection apparatusASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0853US2024212108A1Sem image enhancementASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0952US12255042B2Numerically compensating SEM-induced charging using diffusion-based modelASML NETHERLANDS BV·Filed 2020·Granted Mar 18, 2025·0 cites·15 claims
- 1052US11243179B2Inspection tool, lithographic apparatus, electron beam source and an inspection methodASML NETHERLANDS BV·Filed 2018·Granted Feb 8, 2022·0 cites·20 claims
- 1152US2020018944A1Sem image enhancement methods and systemsASML NETHERLANDS BV·Filed 2019·Application pending·0 cites
- 1251US11668661B2Inspection tool and inspection methodASML NETHERLANDS BV·Filed 2020·Granted Jun 6, 2023·0 cites·10 claims
- 1351US2025231129A1E-beam optimization for overlay measurement of buried featuresASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1451US2023021320A1Removing an artifact from an imageASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →