Inventor · disambiguated record
Theodore A. Khoury
Also filed as: KHOURY THEODORE A · KHOURY THEODORE ANDREW
43 granted patents·2 pending applications·2,321 citations·filing 1996–2003
99Inventor score
Top patents by PatentIndex Score
45 records- 0199US6250933B1Contact structure and production method thereofADVANTEST CORP·Filed 2000·Granted Jun 26, 2001·209 cites·17 claims
- 0296US6677245B2Contact structure production methodADVANTEST CORP·Filed 2002·Granted Jan 13, 2004·100 cites·20 claims
- 0396US6586956B2Probe contract system having planarity adjustment mechanismADVANTEST CORP·Filed 2001·Granted Jul 1, 2003·75 cites·29 claims
- 0495US6676438B2Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2001·Granted Jan 13, 2004·92 cites·20 claims
- 0595US6576485B2Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2002·Granted Jun 10, 2003·74 cites·15 claims
- 0695US6031282AHigh performance integrated circuit chip packageADVANTEST CORP·Filed 1998·Granted Feb 29, 2000·187 cites·14 claims
- 0794US6736665B2Contact structure production methodADVANTEST CORP·Filed 2002·Granted May 18, 2004·66 cites·10 claims
- 0893US6436802B1Method of producing contact structureADVANTEST CORP·Filed 2000·Granted Aug 20, 2002·66 cites·36 claims
- 0992US6440775B2Method and apparatus for edge connection between elements of an integrated circuitADVANTEST CORP·Filed 2001·Granted Aug 27, 2002·67 cites·5 claims
- 1091US6255727B1Contact structure formed by microfabrication processADVANTEST CORP·Filed 1999·Granted Jul 3, 2001·84 cites·30 claims
- 1191US6184576B1Packaging and interconnection of contact structureADVANTEST CORP·Filed 1998·Granted Feb 6, 2001·121 cites·49 claims
- 1291US6127831AMethod of testing a semiconductor device by automatically measuring probe tip parametersMOTOROLA INC·Filed 1997·Granted Oct 3, 2000·130 cites·17 claims
- 1391US5989994AMethod for producing contact structuresADVANTEST CORP·Filed 1998·Granted Nov 23, 1999·82 cites·22 claims
- 1490US6452407B2Probe contactor and production method thereofADVANTEST CORP·Filed 2000·Granted Sep 17, 2002·78 cites·13 claims
- 1590US6441629B1Probe contact system having planarity adjustment mechanismADVANTEST CORP·Filed 2000·Granted Aug 27, 2002·37 cites·17 claims
- 1690US6218203B1Method of producing a contact structureADVANTEST CORP·Filed 1999·Granted Apr 17, 2001·120 cites·18 claims
- 1789US6750136B2Contact structure production methodADVANTEST CORP·Filed 2003·Granted Jun 15, 2004·36 cites·15 claims
- 1889US6476626B2Probe contact system having planarity adjustment mechanismADVANTEST CORP·Filed 2001·Granted Nov 5, 2002·32 cites·9 claims
- 1989US6472890B2Method for producing a contact structureADVANTEST CORP·Filed 2002·Granted Oct 29, 2002·35 cites·9 claims
- 2089US6351133B1Packaging and interconnection of contact structureADVANTEST CORP·Filed 1999·Granted Feb 26, 2002·48 cites·10 claims
- 2188US6420884B1Contact structure formed by photolithography processADVANTEST CORP·Filed 1999·Granted Jul 16, 2002·73 cites·7 claims
- 2288US6232669B1Contact structure having silicon finger contactors and total stack-up structure using sameADVANTEST CORP·Filed 1999·Granted May 15, 2001·70 cites·19 claims
- 2387US6369445B1Method and apparatus for edge connection between elements of an integrated circuitADVANTEST CORP·Filed 2000·Granted Apr 9, 2002·40 cites·33 claims
- 2484US6471538B2Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2000·Granted Oct 29, 2002·31 cites·17 claims
- 2583US6641430B2Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2001·Granted Nov 4, 2003·34 cites·18 claims
- 2683US6612861B2Contact structure and production method thereofADVANTEST CORP·Filed 2002·Granted Sep 2, 2003·25 cites·15 claims
- 2783US6504223B1Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2000·Granted Jan 7, 2003·26 cites·21 claims
- 2882US6466043B2Contact structure for electrical communication with contact targetsADVANTEST CORP·Filed 2002·Granted Oct 15, 2002·21 cites·7 claims
- 2981US6535003B2Contact structure having silicon finger contactorADVANTEST CORP·Filed 2002·Granted Mar 18, 2003·26 cites·20 claims
- 3080US6343940B1Contact structure and assembly mechanism thereofADVANTEST CORP·Filed 2000·Granted Feb 5, 2002·26 cites·26 claims
- 3180US6297164B1Method for producing contact structuresADVANTEST CORP·Filed 1998·Granted Oct 2, 2001·46 cites·19 claims
- 3278US6399900B1Contact structure formed over a grooveADVANTEST CORP·Filed 1999·Granted Jun 4, 2002·44 cites·10 claims
- 3372US6579804B1Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2000·Granted Jun 17, 2003·18 cites·17 claims
- 3469US5814733AMethod of characterizing dynamics of a workpiece handling systemMOTOROLA INC·Filed 1996·Granted Sep 29, 1998·38 cites·8 claims
- 3562US6540524B1Contact structure and production method thereofADVANTEST CORP·Filed 2000·Granted Apr 1, 2003·7 cites·8 claims
- 3662US6359454B1Pick and place mechanism for contactorADVANTEST CORP·Filed 1999·Granted Mar 19, 2002·23 cites·9 claims
- 3758US6576301B1Method of producing contact structureADVANTEST CORP·Filed 2000·Granted Jun 10, 2003·5 cites·14 claims
- 3856US6608385B2Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2001·Granted Aug 19, 2003·8 cites·15 claims
- 3953US6548756B2Packaging and interconnection of contact structureADVANTEST CORP·Filed 2001·Granted Apr 15, 2003·4 cites·30 claims
- 4051US6255585B1Packaging and interconnection of contact structureADVANTEST CORP·Filed 1999·Granted Jul 3, 2001·13 cites·17 claims
- 4147US7276920B2Packaging and interconnection of contact structureADVANTEST CORP·Filed 2001·Granted Oct 2, 2007·3 cites·14 claims
- 4245US6534710B2Packaging and interconnection of contact structureADVANTEST CORP·Filed 2001·Granted Mar 18, 2003·1 cites·8 claims
- 4338US6384616B1Packaging and interconnection of contact structureADVANTEST CORP·Filed 2001·Granted May 7, 2002·0 cites·14 claims
- 4435US2002048973A1Contact structure and production method thereof and probe contact assembly using sameFiled 2001·Application pending·0 cites
- 4534US2004051541A1Contact structure with flexible cable and probe contact assembly using sameFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →