Inventor · disambiguated record
Thomas G. Miller
Also filed as: MILLER THOMAS · MILLER THOMAS G · MILLER THOMAS GARY
22 granted patents·1 pending application·86 citations·filing 2012–2022
93Inventor score
Top patents by PatentIndex Score
23 records- 0195US9818584B2Internal split faraday shield for a plasma sourceFEI CO·Filed 2014·Granted Nov 14, 2017·21 cites·17 claims
- 0294US9934930B2High aspect ratio x-ray targets and uses of sameFEI CO·Filed 2015·Granted Apr 3, 2018·19 cites·11 claims
- 0393US9601313B2Automated TEM sample preparationFEI CO·Filed 2015·Granted Mar 21, 2017·14 cites·20 claims
- 0491US10366860B2High aspect ratio X-ray targets and uses of sameFEI CO·Filed 2018·Granted Jul 30, 2019·5 cites·21 claims
- 0585US8884247B2System and method for ex situ analysis of a substrateFEI CO·Filed 2012·Granted Nov 11, 2014·9 cites·7 claims
- 0685US8779357B1Multiple image metrologyFEI CO·Filed 2013·Granted Jul 15, 2014·5 cites·36 claims
- 0781US10340119B2Automated TEM sample preparationFEI CO·Filed 2017·Granted Jul 2, 2019·2 cites·24 claims
- 0880US10465293B2Dose-based end-pointing for low-kV FIB milling TEM sample preparationMILLER THOMAS G·Filed 2012·Granted Nov 5, 2019·4 cites·28 claims
- 0979US11176656B2Artificial intelligence-enabled preparation end-pointingFEI CO·Filed 2019·Granted Nov 16, 2021·2 cites·22 claims
- 1075US10825651B2Automated TEM sample preparationFEI CO·Filed 2019·Granted Nov 3, 2020·1 cites·20 claims
- 1175US10707137B2Methods and apparatus for semiconductor sample workflowFEI CO·Filed 2019·Granted Jul 7, 2020·1 cites·10 claims
- 1274US12293525B2Artificial intelligence enabled metrologyFEI CO·Filed 2022·Granted May 6, 2025·0 cites·15 claims
- 1374US8766214B2Method of preparing and imaging a lamella in a particle-optical apparatusFEI CO·Filed 2013·Granted Jul 1, 2014·3 cites·20 claims
- 1470US11313042B2Dose-based end-pointing for low-kV FIB milling in TEM sample preparationFEI CO·Filed 2019·Granted Apr 26, 2022·0 cites·18 claims
- 1568US11847813B2Artificial intelligence-enabled preparation end-pointingFEI CO·Filed 2021·Granted Dec 19, 2023·0 cites·22 claims
- 1668US11798804B2Method of material depositionFEI CO·Filed 2020·Granted Oct 24, 2023·0 cites·15 claims
- 1762US12249482B2Microscopy feedback for improved milling accuracyFEI CO·Filed 2022·Granted Mar 11, 2025·0 cites·26 claims
- 1859US11069523B2Method of material depositionFEI CO·Filed 2018·Granted Jul 20, 2021·0 cites·12 claims
- 1954US10176969B2Method for rapid switching between a high current mode and a low current mode in a charged particle beam systemFEI CO·Filed 2016·Granted Jan 8, 2019·0 cites·22 claims
- 2054US9978586B2Method of material depositionFEI CO·Filed 2016·Granted May 22, 2018·0 cites·16 claims
- 2152US9691583B2Imaging and processing for plasma ion sourceFEI CO·Filed 2015·Granted Jun 27, 2017·0 cites·18 claims
- 2249US10373881B2Defect analysisFEI CO·Filed 2017·Granted Aug 6, 2019·0 cites·22 claims
- 2345US2021088770A1Pose estimation using sematic segmentationFEI CO·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →