Inventor · disambiguated record
Thomas Thaler
Also filed as: THALER THOMAS
13 granted patents·3 pending applications·316 citations·filing 1995–2025
88Inventor score
Files withZEISS CARL SMT GMBH10CHEMSPEED TECH AG2SULZER MEDIZINALTECHNIK AG2BRAUN BIOTECH INT GMBH1ZEISS CARL SMS GMBH1
Top patents by PatentIndex Score
16 records- 0181US5837235AProcess for regenerating bone and cartilageSULZER MEDIZINALTECHNIK AG·Filed 1995·Granted Nov 17, 1998·136 cites·26 claims
- 0278US2024152057A1Apparatus and method for characterizing a microlithographic maskZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0372US10698318B2Method and device for characterizing a mask for microlithographyZEISS CARL SMT GMBH·Filed 2018·Granted Jun 30, 2020·1 cites·19 claims
- 0471US5658343AAreal implantSULZER MEDIZINALTECHNIK AG·Filed 1995·Granted Aug 19, 1997·147 cites·57 claims
- 0570US11914303B2Apparatus and method for characterizing a microlithographic maskZEISS CARL SMT GMBH·Filed 2021·Granted Feb 27, 2024·0 cites·17 claims
- 0670US10788748B2Method and appliance for predicting the imaging result obtained with a mask when a lithography process is carried outZEISS CARL SMT GMBH·Filed 2018·Granted Sep 29, 2020·1 cites·26 claims
- 0767US2025369899A1Mask metrology measuring device and method for examining a photomaskZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0862US9869640B2Method and device for examining a maskZEISS CARL SMT GMBH·Filed 2014·Granted Jan 16, 2018·0 cites·20 claims
- 0959US10987666B2Metering apparatusCHEMSPEED TECH AG·Filed 2015·Granted Apr 27, 2021·1 cites·25 claims
- 1055US11899358B2Method for measuring photomasksZEISS CARL SMT GMBH·Filed 2021·Granted Feb 13, 2024·0 cites·20 claims
- 1152US10539865B2Method and device for determining an OPC modelZEISS CARL SMT GMBH·Filed 2017·Granted Jan 21, 2020·0 cites·24 claims
- 1247US10265701B2Substance containerCHEMSPEED TECH AG·Filed 2015·Granted Apr 23, 2019·0 cites·21 claims
- 1347US2015198541A1Method and device for examining a maskZEISS CARL SMS GMBH·Filed 2015·Application pending·0 cites
- 1445US10578975B2Method for correcting the critical dimension uniformity of a photomask for semiconductor lithographyZEISS CARL SMT GMBH·Filed 2018·Granted Mar 3, 2020·0 cites·11 claims
- 1544US5637496ADevice and method for conveying and separating a suspension with biological cells or micro-organismsBRAUN BIOTECH INT GMBH·Filed 1995·Granted Jun 10, 1997·30 cites·28 claims
- 1643US9535244B2Emulation of reproduction of masks corrected by local density variationsZEISS CARL SMT GMBH·Filed 2015·Granted Jan 3, 2017·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →