Inventor · disambiguated record
Thomas Warren Weeks, Jr.
Also filed as: WEEKS JR THOMAS WARREN · WEEKS THOMAS W
13 granted patents·2 pending applications·33 citations·filing 1991–2023
87Inventor score
Top patents by PatentIndex Score
15 records- 0194US11863061B2Switch for a lighting systemPROGRESS LIGHTING LLC·Filed 2022·Granted Jan 2, 2024·2 cites·20 claims
- 0287US10702617B2Antimicrobial backlit deviceHUBBELL INC·Filed 2018·Granted Jul 7, 2020·6 cites·8 claims
- 0381US12388352B2Switch for a lighting systemPROGRESS LIGHTING LLC·Filed 2023·Granted Aug 12, 2025·0 cites·19 claims
- 0480US11342833B2Switch for a lighting systemHUBBELL INC·Filed 2018·Granted May 24, 2022·2 cites·20 claims
- 0579US10563851B2LED circuit board layout for low profile lighting fixtureHUBBELL INC·Filed 2017·Granted Feb 18, 2020·2 cites·19 claims
- 0672US12404996B2LED circuit board layout for low profile lighting fixturePROGRESS LIGHTING LLC·Filed 2021·Granted Sep 2, 2025·0 cites·20 claims
- 0770US11143391B2LED circuit board layout for low profile lighting fixtureHUBBELL INC·Filed 2021·Granted Oct 12, 2021·0 cites·20 claims
- 0867US10928048B2LED circuit board layout for low profile lighting fixtureHUBBELL INC·Filed 2020·Granted Feb 23, 2021·0 cites·20 claims
- 0963US5221425AMethod for reducing foreign matter on a wafer etched in a reactive ion etching processIBM·Filed 1991·Granted Jun 22, 1993·21 cites·11 claims
- 1058US2021023245A1Antimicrobial Backlit DeviceHUBBELL INC·Filed 2020·Application pending·0 cites
- 1148US11590248B2Pulsing high intensity narrow spectrum lightHUBBELL LIGHTING INC·Filed 2018·Granted Feb 28, 2023·0 cites·20 claims
- 1243US10056306B2Test structure for monitoring interface delaminationGLOBALFOUNDRIES INC·Filed 2016·Granted Aug 21, 2018·0 cites·20 claims
- 1341US9577023B2Metal wires of a stacked inductorGLOBALFOUNDRIES INC·Filed 2013·Granted Feb 21, 2017·0 cites·14 claims
- 1440US11449020B2Ceiling fan that controls thermostat based on presence informationHUBBELL INC·Filed 2018·Granted Sep 20, 2022·0 cites·10 claims
- 1537US2008204068A1Method for estimating defects in an npn transistor arrayIBM·Filed 2007·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Thomas Warren Weeks, Jr. files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →