Inventor · disambiguated record
Tino Hofmann
Also filed as: HOFMANN TINO
18 granted patents·2 pending applications·81 citations·filing 2009–2020
92Inventor score
Top patents by PatentIndex Score
20 records- 0191US10073120B1Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of useJ A WOOLLAM CO INC·Filed 2017·Granted Sep 11, 2018·7 cites·26 claims
- 0291US9851294B1Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of useJ A WOOLLAM CO INC·Filed 2015·Granted Dec 26, 2017·9 cites·39 claims
- 0390US8705032B2Terahertz-infrared ellipsometer system, and method of useHERZINGER CRAIG M·Filed 2013·Granted Apr 22, 2014·7 cites·21 claims
- 0489US8416408B1Terahertz-infrared ellipsometer system, and method of useHERZINGER CRAIG M·Filed 2010·Granted Apr 9, 2013·8 cites·11 claims
- 0588US8248607B1Empirical correction for spectroscopic ellipsometric measurements of rough or textured surfacesHERZINGER CRAIG M·Filed 2010·Granted Aug 21, 2012·8 cites·14 claims
- 0687US9739710B2Optical sensing and separation based on ordered three-dimensional nanostructured surfacesNUTECH VENTURES·Filed 2013·Granted Aug 22, 2017·7 cites·22 claims
- 0786US10026167B1Method of obtaining micrographs of transparent or semi-transparent specimens using anisotropic contrastJ A WOOLLAM CO INC·Filed 2015·Granted Jul 17, 2018·6 cites·38 claims
- 0882US10101265B1Birefringence imaging chromatography based on highly ordered 3D nanostructuresSCHUBERT MATHIAS M·Filed 2015·Granted Oct 16, 2018·3 cites·47 claims
- 0982US8169611B2Terahertz-infrared ellipsometer system, and method of useHERZINGER CRAIG M·Filed 2009·Granted May 1, 2012·10 cites·23 claims
- 1079US8441635B2Mass sensorSCHUBERT MATHIAS M·Filed 2010·Granted May 14, 2013·5 cites·38 claims
- 1178US10190978B2Optical sensing and separation based on ordered 3D nanostructured surfacesNUTECH VENTURES·Filed 2017·Granted Jan 29, 2019·1 cites·24 claims
- 1275US8507860B2Terahertz resonatorSCHUBERT EVA·Filed 2010·Granted Aug 13, 2013·7 cites·25 claims
- 1364US2021090857A1Systems and methods utilizing long wavelength electromagnetic radiation for feature definitionSEAGATE TECHNOLOGY LLC·Filed 2020·Application pending·0 cites
- 1463US10048059B1Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited at or etched from a working electrode that preferrably comprises non-normal oriented nanofibersSCHUBERT MATHIAS M·Filed 2016·Granted Aug 14, 2018·1 cites·24 claims
- 1558US8711599B2Polarization-coupled ferroelectric unipolar junction memory and energy storage deviceSCHUBERT MATHIAS M·Filed 2011·Granted Apr 29, 2014·2 cites·36 claims
- 1655US2016041089A1Systems and methods utilizing long wavelength electromagnetic radiation for feature definitionHOVINEN MINNA·Filed 2014·Application pending·0 cites
- 1753US9041927B1Terahertz-infrared ellipsometer system, and method of useHERZINGER CRAIG M·Filed 2013·Granted May 26, 2015·0 cites·19 claims
- 1849US10914866B1Methods and materials for metamaterials exhibiting form-induced birefringenceUNIV OF NORTH CAROLINA CHARLOTTE·Filed 2018·Granted Feb 9, 2021·0 cites·18 claims
- 1941US8934096B2Terahertz-infrared ellipsometer system, and method of useHERZINGER CRAIG M·Filed 2012·Granted Jan 13, 2015·0 cites·23 claims
- 2037US8488119B2Terahertz-infrared ellipsometer system, and method of useHERZINGER CRAIG M·Filed 2010·Granted Jul 16, 2013·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →