Inventor · disambiguated record
Tohru Ando
Also filed as: ANDO TOHRU
18 granted patents·2 pending applications·51 citations·filing 2006–2014
91Inventor score
Top patents by PatentIndex Score
20 records- 0182US7663104B2Specimen inspection equipment and how to make electron beam absorbed current imagesHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 16, 2010·6 cites·8 claims
- 0279US7732791B2Semiconductor testing method and semiconductor testerHITACHI HIGH TECH CORP·Filed 2007·Granted Jun 8, 2010·5 cites·19 claims
- 0378USD774075SDisplay screen with graphical user interfaceHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 13, 2016·22 cites·1 claims
- 0470US7989766B2Sample inspection apparatusHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 2, 2011·2 cites·17 claims
- 0569US8178840B2Specimen inspection equipment and how to make the electron beam absorbed current imagesOBUKI TOMOHARU·Filed 2010·Granted May 15, 2012·2 cites·5 claims
- 0668US9129773B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Sep 8, 2015·2 cites·19 claims
- 0768US8442300B2Specified position identifying method and specified position measuring apparatusTSUNETA RURIKO·Filed 2007·Granted May 14, 2013·6 cites·9 claims
- 0865US8309922B2Semiconductor inspection method and device that consider the effects of electron beamsANDO TOHRU·Filed 2010·Granted Nov 13, 2012·2 cites·10 claims
- 0958US9792832B2Charged particle beam apparatus, specimen observation system and operation programHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 17, 2017·0 cites·8 claims
- 1058US7700916B2Logical CAD navigation for device characteristics evaluation systemHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 20, 2010·2 cites·19 claims
- 1151US9741531B2Charged particle beam device enabling facilitated EBSD detector analysis of desired position and control method thereofHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 22, 2017·0 cites·25 claims
- 1248US8067752B2Semiconductor testing method and semiconductor testerANDO TOHRU·Filed 2010·Granted Nov 29, 2011·0 cites·10 claims
- 1343US10176968B2Method for adjusting charged particle beam device and adjusting beam aperture based on a selected emission condition and charged particle beam device for sameHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 8, 2019·0 cites·13 claims
- 1443US8178837B2Logical CAD navigation for device characteristics evaluation systemANDO TOHRU·Filed 2010·Granted May 15, 2012·0 cites·8 claims
- 1540US9412557B2Charged particle beam apparatus and programHITACHI HIGH TECH CORP·Filed 2013·Granted Aug 9, 2016·0 cites·16 claims
- 1633US2011291692A1Method and apparatus for inspecting semiconductor using absorbed current imageANDO TOHRU·Filed 2010·Application pending·0 cites
- 1732US8754664B2Inspection method and deviceNARA YASUHIKO·Filed 2011·Granted Jun 17, 2014·0 cites·20 claims
- 1831US2013119999A1Specimen Testing Device and Method for Creating Absorbed Current ImageOBUKI TOMOHARU·Filed 2011·Application pending·0 cites
- 1930USD780767SDisplay screen with graphical user interfaceHITACHI HIGH TECH CORP·Filed 2013·Granted Mar 7, 2017·1 cites·1 claims
- 2028USD774516SDisplay screen with graphical user interfaceHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 20, 2016·1 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →