Inventor · disambiguated record
Toshiaki Awaji
Also filed as: AWAJI TOSHIAKI
17 granted patents·99 citations·filing 1995–2009
93Inventor score
Files withADVANTEST CORP17
Top patents by PatentIndex Score
17 records- 0187US7876120B2Test apparatus, pin electronics card, electrical device and switchADVANTEST CORP·Filed 2008·Granted Jan 25, 2011·16 cites·10 claims
- 0287US7512872B2Test apparatus and test methodADVANTEST CORP·Filed 2006·Granted Mar 31, 2009·9 cites·7 claims
- 0385US7707484B2Test apparatus and test method with features of adjusting phase difference between data and reference clock and acquiring adjusted dataADVANTEST CORP·Filed 2009·Granted Apr 27, 2010·7 cites·4 claims
- 0484US7557561B2Electronic device, circuit and test apparatusADVANTEST CORP·Filed 2007·Granted Jul 7, 2009·7 cites·18 claims
- 0576US7589549B2Driver circuit and test apparatusADVANTEST CORP·Filed 2007·Granted Sep 15, 2009·9 cites·9 claims
- 0665US7755377B2Driver circuit and test apparatusADVANTEST CORP·Filed 2007·Granted Jul 13, 2010·5 cites·10 claims
- 0764US7453932B2Test device and setting methodADVANTEST CORP·Filed 2005·Granted Nov 18, 2008·4 cites·8 claims
- 0857US7965092B2Differential signal transmitting apparatus and a test apparatusADVANTEST CORP·Filed 2008·Granted Jun 21, 2011·2 cites·13 claims
- 0955US7123025B2Differential comparator circuit, test head, and test apparatusADVANTEST CORP·Filed 2005·Granted Oct 17, 2006·2 cites·7 claims
- 1054US5654655ADriver circuit for semiconductor test systemADVANTEST CORP·Filed 1995·Granted Aug 5, 1997·12 cites·5 claims
- 1152US5699001ADriver circuit for semiconductor test systemADVANTEST CORP·Filed 1996·Granted Dec 16, 1997·14 cites·14 claims
- 1251US7459897B2Terminator circuit, test apparatus, test head, and communication deviceADVANTEST CORP·Filed 2007·Granted Dec 2, 2008·1 cites·16 claims
- 1351US7389190B2Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatusADVANTEST CORP·Filed 2004·Granted Jun 17, 2008·5 cites·18 claims
- 1447US7962110B2Driver circuit and test apparatusADVANTEST CORP·Filed 2008·Granted Jun 14, 2011·0 cites·10 claims
- 1540US7538582B2Driver circuit, test apparatus and adjusting methodADVANTEST CORP·Filed 2005·Granted May 26, 2009·0 cites·13 claims
- 1637US6257933B1ConnectorADVANTEST CORP·Filed 1999·Granted Jul 10, 2001·6 cites·5 claims
- 1735US7208982B2Sampling circuitADVANTEST CORP·Filed 2005·Granted Apr 24, 2007·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →