Inventor · disambiguated record
Toyohiro Chikyo
Also filed as: CHIKYO TOYOHIRO
18 granted patents·4 pending applications·18 citations·filing 2000–2018
89Inventor score
Files withNAT INST MATERIALS SCIENCE10NAT INST FOR MATERIALS SCIENCE8JAPAN SCIENCE & TECH CORP1KAWAKITA JIN1NAGATA TAKAHIRO1
Top patents by PatentIndex Score
22 records- 0182US11486843B2Dryness/wetness responsive sensorNAT INST MATERIALS SCIENCE·Filed 2018·Granted Nov 1, 2022·2 cites·10 claims
- 0277US9825180B2Thin-film transistor and method for manufacturing sameNAT INST MATERIALS SCIENCE·Filed 2016·Granted Nov 21, 2017·2 cites·4 claims
- 0374US8575038B2Method for reducing thickness of interfacial layer, method for forming high dielectric constant gate insulating film, high dielectric constant gate insulating film, high dielectric constant gate oxide film, and transistor having high dielectric constant gate oxide filmUMEZAWA NAOTO·Filed 2012·Granted Nov 5, 2013·4 cites·10 claims
- 0464US8759925B2Method for reducing thickness of interfacial layer, method for forming high dielectric constant gate insulating film, high dielectric constant gate insulating film, high dielectric constant gate oxide film, and transistor having high dielectric constant gate oxide filmNAT INST FOR MATERIALS SCIENCE·Filed 2013·Granted Jun 24, 2014·1 cites·5 claims
- 0560US11163829B2Search method, search device, and search systemNAT INST MATERIALS SCIENCE·Filed 2018·Granted Nov 2, 2021·1 cites·15 claims
- 0660US2019145920A1DRYNESS/WETNESS RESPONSIVE SENSOR HAVING FIRST AND SECOND WIRES SPACED 5 nm TO LESS THAN 20 um APARTNAT INST MATERIALS SCIENCE·Filed 2018·Application pending·0 cites
- 0757US11454603B2Dew point measuring method and dew point measuring deviceNAT INST MATERIALS SCIENCE·Filed 2017·Granted Sep 27, 2022·0 cites·20 claims
- 0856US7259409B2Thin film device and its fabrication methodNAT INST FOR MATERIALS SCIENCE·Filed 2003·Granted Aug 21, 2007·6 cites·3 claims
- 0955US11138772B2Search system, search method, and material property database management apparatusNAT INST MATERIALS SCIENCE·Filed 2016·Granted Oct 5, 2021·1 cites·17 claims
- 1055US10267756B2Dryness/wetness responsive sensor having first and second wires spaced 5 nm to less than 20 μm apartNAT INST MATERIALS SCIENCE·Filed 2015·Granted Apr 23, 2019·0 cites·19 claims
- 1149US9957371B2Nanoparticle-containing polymer nanowire and method for producing the sameNAT INST MATERIALS SCIENCE·Filed 2012·Granted May 1, 2018·0 cites·11 claims
- 1248US10043598B2Process for precipitation of conducting polymer/metal composites, and conducting polymer/metal compositesKAWAKITA JIN·Filed 2012·Granted Aug 7, 2018·0 cites·6 claims
- 1348US7759662B2Field electron emission element, a method of manufacturing the same and a field electron emission method using such an element as well as an emission/display device employing such a field electron emission element and a method of manufacturing the sameNAT INST FOR MATERIALS SCIENCE·Filed 2005·Granted Jul 20, 2010·0 cites·7 claims
- 1447US9703197B2High-sensitivity multilayer resist film and method of increasing photosensitivity of resist filmNAT INST FOR MATERIALS SCIENCE·Filed 2014·Granted Jul 11, 2017·0 cites·5 claims
- 1546US9622346B2Adhesive body comprising conductive polymer-metal complex and substrate and method for forming the same, conductive polymer-metal complex dispersion liquid, method for manufacturing the same and method for applying the same, and method for filling hole using conductive materialNAT INST FOR MATERIALS SCIENCE·Filed 2013·Granted Apr 11, 2017·0 cites·9 claims
- 1645US10830573B2Droplet size determining device and droplet size determining methodNAT INST MATERIALS SCIENCE·Filed 2017·Granted Nov 10, 2020·0 cites·12 claims
- 1745US6723164B1Method for stabilizing oxide-semiconductor interface by using group 5 element and stabilized semiconductorJAPAN SCIENCE & TECH CORP·Filed 2000·Granted Apr 20, 2004·1 cites·3 claims
- 1842US11856664B2Method and system for preventing dew condensation and light scattering due to dew condensationNAT INST MATERIALS SCIENCE·Filed 2018·Granted Dec 26, 2023·0 cites·20 claims
- 1942US2011204520A1Metal electrode and semiconductor element using the sameNAT INST FOR MATERIALS SCIENCE·Filed 2008·Application pending·0 cites
- 2042US2009170294A1Method for film depositing group iii nitride such as gallium nitrideNAGATA TAKAHIRO·Filed 2006·Application pending·0 cites
- 2131US2017084538A1Silver diffusion barrier material, silver diffusion barrier, and semiconductor device using the sameNAT INST FOR MATERIALS SCIENCE·Filed 2015·Application pending·0 cites
- 2229US7091569B2Gate and CMOS structure and MOS structureNAT INST FOR MATERIALS SCIENCE·Filed 2002·Granted Aug 15, 2006·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →