Inventor · disambiguated record
Tomoya Endo
Also filed as: ENDO TOMOYA
18 granted patents·5 pending applications·29 citations·filing 2009–2024
88Inventor score
Top patents by PatentIndex Score
23 records- 0186US8130004B2Probe apparatus and method for correcting contact position by adjusting overdriving amountYAMADA HIROSHI·Filed 2009·Granted Mar 6, 2012·10 cites·5 claims
- 0286US7944200B2Probe apparatusTOKYO ELECTRON LTD·Filed 2009·Granted May 17, 2011·13 cites·11 claims
- 0381US11181573B2Inspection apparatus and cleaning method of inspection apparatusTOKYO ELECTRON LTD·Filed 2019·Granted Nov 23, 2021·2 cites·16 claims
- 0476US12470119B2Vibration generating deviceALPS ALPINE CO LTD·Filed 2023·Granted Nov 11, 2025·0 cites·3 claims
- 0574US10205279B2Interface apparatus, interface unit, probe apparatus, and connection methodTOKYO ELECTRON LTD·Filed 2016·Granted Feb 12, 2019·4 cites·9 claims
- 0671US12105895B2Operating device using variable resistorALPS ALPINE CO LTD·Filed 2022·Granted Oct 1, 2024·0 cites·3 claims
- 0760US12293873B2Input deviceALPS ALPINE CO LTD·Filed 2024·Granted May 6, 2025·0 cites·6 claims
- 0860US2024275250A1Vibration generating deviceALPS ALPINE CO LTD·Filed 2023·Application pending·0 cites
- 0960US2024275252A1Vibration generating device and method of manufacturing vibration generating deviceALPS ALPINE CO LTD·Filed 2024·Application pending·0 cites
- 1059US11454667B2Inspection apparatus and method of adjusting position of chuck topTOKYO ELECTRON LTD·Filed 2021·Granted Sep 27, 2022·0 cites·6 claims
- 1154US11131708B2Aligning mechanism and aligning methodTOKYO ELECTRON LTD·Filed 2020·Granted Sep 28, 2021·0 cites·7 claims
- 1252US11385286B2Method for controlling test apparatus and test apparatusTOKYO ELECTRON LTD·Filed 2020·Granted Jul 12, 2022·0 cites·7 claims
- 1350US11226368B2Placement apparatus control method, placement apparatus, and inspection apparatusTOKYO ELECTRON LTD·Filed 2020·Granted Jan 18, 2022·0 cites·15 claims
- 1449US11364435B2Operation deviceALPS ALPINE CO LTD·Filed 2021·Granted Jun 21, 2022·0 cites·7 claims
- 1549US7994809B2Transfer mechanism for target object to be inspectedTOKYO ELECTRON LTD·Filed 2009·Granted Aug 9, 2011·0 cites·6 claims
- 1649US2025208169A1Inspection method and inspection deviceTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 1749US2012126841A1Probe apparatus and method for correcting contact positionYAMADA HIROSHI·Filed 2012·Application pending·0 cites
- 1849US2012119766A1Probe apparatus and method for correcting contact positionYAMADA HIROSHI·Filed 2012·Application pending·0 cites
- 1946US11391758B2Testing apparatus and method of controlling testing apparatusTOKYO ELECTRON LTD·Filed 2021·Granted Jul 19, 2022·0 cites·6 claims
- 2040US11454664B2Testing systemTOKYO ELECTRON LTD·Filed 2018·Granted Sep 27, 2022·0 cites·20 claims
- 2140US11133214B2Substrate transportation methodTOKYO ELECTRON LTD·Filed 2018·Granted Sep 28, 2021·0 cites·10 claims
- 2239US11360115B2Inspection systemTOKYO ELECTRON LTD·Filed 2019·Granted Jun 14, 2022·0 cites·16 claims
- 2339US10809294B2Stage device and probe deviceTOKYO ELECTRON LTD·Filed 2018·Granted Oct 20, 2020·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →