Inventor · disambiguated record
Tohru Furuyama
Also filed as: FURUYAMA TOHRU
53 granted patents·1 pending application·1,481 citations·filing 1980–2008
99Inventor score
Top patents by PatentIndex Score
54 records- 0197US5479370ASemiconductor memory with bypass circuitTOSHIBA KK·Filed 1995·Granted Dec 26, 1995·196 cites·27 claims
- 0293US5148393AMos dynamic semiconductor memory cellTOSHIBA KK·Filed 1989·Granted Sep 15, 1992·74 cites·11 claims
- 0392US4569036ASemiconductor dynamic memory deviceTOKYO SHIBAURA ELECTRIC CO·Filed 1983·Granted Feb 4, 1986·59 cites·8 claims
- 0489US5525820ASemiconductor memory cellTOSHIBA KK·Filed 1994·Granted Jun 11, 1996·66 cites·57 claims
- 0589US4833341ASemiconductor device with power supply voltage converter circuitTOSHIBA KK·Filed 1987·Granted May 23, 1989·41 cites·8 claims
- 0688US5276647AStatic random access memory including stress test circuitryTOSHIBA KK·Filed 1991·Granted Jan 4, 1994·68 cites·14 claims
- 0786US5298433AMethod for testing semiconductor devicesTOSHIBA KK·Filed 1991·Granted Mar 29, 1994·59 cites·26 claims
- 0884US5287312ADynamic random access memoryTOSHIBA KK·Filed 1991·Granted Feb 15, 1994·36 cites·8 claims
- 0983US5023476ASemiconductor device with power supply mode-change controller for reliability testingTOSHIBA KK·Filed 1989·Granted Jun 11, 1991·29 cites·9 claims
- 1082US5294776AMethod of burning in a semiconductor deviceTOSHIBA KK·Filed 1992·Granted Mar 15, 1994·60 cites·40 claims
- 1182US4841483ASemiconductor memoryTOSHIBA KK·Filed 1987·Granted Jun 20, 1989·40 cites·12 claims
- 1280US4697252ADynamic type semiconductor memory deviceTOKYO SHIBAURA ELECTRIC CO·Filed 1984·Granted Sep 29, 1987·27 cites·14 claims
- 1378US5341326ASemiconductor memory having memory cell units each including cascade-connected MOS transistorsTOSHIBA KK·Filed 1992·Granted Aug 23, 1994·41 cites·43 claims
- 1477US5369612ASemiconductor memory deviceTOSHIBA KK·Filed 1993·Granted Nov 29, 1994·33 cites·5 claims
- 1577US5367481ADynamic random access memory with complementary bit lines and capacitor common lineTOSHIBA KK·Filed 1992·Granted Nov 22, 1994·41 cites·22 claims
- 1676US5265057ASemiconductor memoryTOSHIBA KK·Filed 1991·Granted Nov 23, 1993·35 cites·10 claims
- 1776US5258954ASemiconductor memory including circuitry for driving plural word lines in a test modeTOSHIBA KK·Filed 1992·Granted Nov 2, 1993·37 cites·19 claims
- 1876US4967395ADram with (1/2)VCC precharge and selectively operable limiting circuitTOSHIBA KK·Filed 1989·Granted Oct 30, 1990·32 cites·7 claims
- 1973US5377152ASemiconductor memory and screening test method thereofTOSHIBA KK·Filed 1992·Granted Dec 27, 1994·25 cites·29 claims
- 2073US4733374ADynamic semiconductor memory deviceTOSHIBA KK·Filed 1986·Granted Mar 22, 1988·30 cites·10 claims
- 2171US5386127ASemiconductor device having groups of pads which receive the same signalTOSHIBA KK·Filed 1994·Granted Jan 31, 1995·29 cites·24 claims
- 2270US5500815ASemiconductor memoryTOSHIBA KK·Filed 1992·Granted Mar 19, 1996·27 cites·39 claims
- 2369US5532963ASemiconductor memory and screening test method thereofTOSHIBA KK·Filed 1995·Granted Jul 2, 1996·23 cites·5 claims
- 2468US4368529ASemiconductor memory circuitTOKYO SHIBAURA ELECTRIC CO·Filed 1980·Granted Jan 11, 1983·17 cites·16 claims
- 2567US5359566ADynamic random access memoryTOSHIBA KK·Filed 1992·Granted Oct 25, 1994·26 cites·45 claims
- 2666US6381186B1Dynamic random access memoryTOSHIBA KK·Filed 2001·Granted Apr 30, 2002·9 cites·20 claims
- 2764US4686456AMemory test circuitTOSHIBA KK·Filed 1986·Granted Aug 11, 1987·20 cites·3 claims
- 2863US5506540ABias voltage generation circuitTOSHIBA KK·Filed 1994·Granted Apr 9, 1996·20 cites·9 claims
- 2963US5410512ASemiconductor memory deviceTOSHIBA KK·Filed 1993·Granted Apr 25, 1995·23 cites·10 claims
- 3063US5014245ADynamic random access memory and method for writing data theretoTOSHIBA KK·Filed 1990·Granted May 7, 1991·27 cites·8 claims
- 3160US5343087ASemiconductor device having a substrate bias generatorTOSHIBA KK·Filed 1991·Granted Aug 30, 1994·19 cites·13 claims
- 3260US5317540ASemiconductor memory deviceTOSHIBA KK·Filed 1992·Granted May 31, 1994·19 cites·53 claims
- 3359US4404657ASemiconductor memory circuitTOKYO SHIBAURA ELECTRIC CO·Filed 1980·Granted Sep 13, 1983·12 cites·6 claims
- 3458US5754481AClock synchronous type DRAM with latchTOSHIBA KK·Filed 1997·Granted May 19, 1998·16 cites·8 claims
- 3558US4398267ASemiconductor memory deviceTOKYO SHIBAURA ELECTRIC CO·Filed 1980·Granted Aug 9, 1983·14 cites·18 claims
- 3657US5444652ASemiconductor memory device having a memory cell unit including a plurality of transistors connected in seriesTOSHIBA KK·Filed 1994·Granted Aug 22, 1995·15 cites·6 claims
- 3756US5410505ASemiconductor memory device having a memory cell unit including a plurality of transistors connected in seriesTOSHIBA KK·Filed 1994·Granted Apr 25, 1995·14 cites·55 claims
- 3855US5138427ASemiconductor device having a particular structure allowing for voltage stress test applicationTOSHIBA KK·Filed 1990·Granted Aug 11, 1992·19 cites·22 claims
- 3953US5043597ASubstrate bias generation circuit used in semiconductor integrated circuitTOSHIBA KK·Filed 1990·Granted Aug 27, 1991·15 cites·21 claims
- 4052US5673229ADynamic random access memoryTOSHIBA KK·Filed 1996·Granted Sep 30, 1997·8 cites·20 claims
- 4152US5659507AClock synchronous type DRAM with data latchTOSHIBA KK·Filed 1996·Granted Aug 19, 1997·12 cites·21 claims
- 4251US5432733ASemiconductor memory deviceTOSHIBA KK·Filed 1994·Granted Jul 11, 1995·11 cites·43 claims
- 4348US5428576ASemiconductor device and method of screening the sameTOSHIBA KK·Filed 1994·Granted Jun 27, 1995·10 cites·17 claims
- 4447US6101148ADynamic random access memoryTOSHIBA KK·Filed 1997·Granted Aug 8, 2000·6 cites·25 claims
- 4547US5343430AMethod and circuitry for screening a dynamic memory device for defective circuitsTOSHIBA KK·Filed 1991·Granted Aug 30, 1994·11 cites·21 claims
- 4645USRE37184ESemiconductor memory and screening test method thereofTOSHIBA KK·Filed 1998·Granted May 22, 2001·7 cites·9 claims
- 4744US6317366B1Dynamic random access memoryTOSHIBA KK·Filed 2000·Granted Nov 13, 2001·2 cites·8 claims
- 4843US5383160ADynamic random access memoryTOSHIBA KK·Filed 1994·Granted Jan 17, 1995·9 cites·20 claims
- 4942US2008250231A1Program code conversion apparatus, program code conversion method and recording mediumTOSHIBA KK·Filed 2008·Application pending·0 cites
- 5040US6307796B1Dynamic random access memoryTOSHIBA KK·Filed 2000·Granted Oct 23, 2001·1 cites·4 claims
Showing the top 50 of 54 patent records by PatentIndex Score.
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