Inventor · disambiguated record
Toru Iwaya
Also filed as: IWAYA TORU
21 granted patents·3 pending applications·29 citations·filing 2003–2020
90Inventor score
Files withHITACHI HIGH TECH CORP17HITACHI SCIENCE SYSTEMS LTD3IWAYA TORU2CHINO HAJIME1HIGH TECHNOLOGIES CORP1
Top patents by PatentIndex Score
24 records- 0184US10304653B2Ion milling device, ion source and ion milling methodHITACHI HIGH TECH CORP·Filed 2015·Granted May 28, 2019·3 cites·20 claims
- 0281US11621141B2Ion milling device and ion milling methodHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 4, 2023·2 cites·6 claims
- 0368US10361065B2Ion milling systemHITACHI HIGH TECH CORP·Filed 2015·Granted Jul 23, 2019·1 cites·14 claims
- 0463US11158481B2Ion milling device, ion source, and ion milling methodHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 26, 2021·0 cites·17 claims
- 0563US6920703B2Microstructure drying treatment method and its apparatus and its high pressure vesselHITACHI SCIENCE SYSTEMS LTD·Filed 2004·Granted Jul 26, 2005·15 cites·19 claims
- 0659US11133153B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Sep 28, 2021·0 cites·17 claims
- 0757US7033089B2Method of developing a resist film and a resist development processorHITACHI SCIENCE SYSTEMS LTD·Filed 2003·Granted Apr 25, 2006·6 cites·4 claims
- 0854US12051560B2Ion gun and ion milling machineHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 30, 2024·0 cites·19 claims
- 0954US10008365B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Jun 26, 2018·0 cites·16 claims
- 1051US12020893B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 25, 2024·0 cites·14 claims
- 1151US9761412B2Ion milling apparatus and sample processing methodHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 12, 2017·0 cites·14 claims
- 1250US8921784B2Scanning electron microscopeIWAYA TORU·Filed 2010·Granted Dec 30, 2014·1 cites·6 claims
- 1349US2009057558A1Scanning electron microscopeHIGH TECHNOLOGIES CORP·Filed 2008·Application pending·0 cites
- 1448US9558912B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 31, 2017·0 cites·13 claims
- 1547US9499900B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 22, 2016·0 cites·8 claims
- 1646US7179000B2Method of developing a resist film and a resist development processorHITACHI SCIENCE SYSTEMS LTD·Filed 2006·Granted Feb 20, 2007·0 cites·3 claims
- 1745US2013220806A1Ion milling deviceIWAYA TORU·Filed 2011·Application pending·0 cites
- 1844US11257654B2Ion milling apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Feb 22, 2022·0 cites·11 claims
- 1944US11244802B2Ion milling device and ion source adjusting method for ion milling deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Feb 8, 2022·0 cites·15 claims
- 2043US8934006B2Charged-particle microscope and method for controlling sameCHINO HAJIME·Filed 2010·Granted Jan 13, 2015·1 cites·7 claims
- 2142US2008202920A1Ion Milling system and ion milling methodHITACHI HIGH TECH CORP·Filed 2008·Application pending·0 cites
- 2241US10332722B2Ion milling device and ion milling methodHITACHI HIGH TECH CORP·Filed 2015·Granted Jun 25, 2019·0 cites·10 claims
- 2340US10269534B2Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Apr 23, 2019·0 cites·16 claims
- 2436US10832889B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Nov 10, 2020·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →