Inventor · disambiguated record
Tony Lin
Also filed as: LIN TONY · LIN TONY-SHENG
77 granted patents·29 pending applications·2,013 citations·filing 1997–2016
99Inventor score
Top patents by PatentIndex Score
106 records- 0195US6319807B1Method for forming a semiconductor device by using reverse-offset spacer processUNITED MICROELECTRONICS CORP·Filed 2000·Granted Nov 20, 2001·95 cites·13 claims
- 0295USD449860SElectric scooterFiled 2001·Granted Oct 30, 2001·60 cites·1 claims
- 0395USD406938SOutsole for a golf shoeLIN TONY·Filed 1998·Granted Mar 23, 1999·60 cites·1 claims
- 0494US5950090AMethod for fabricating a metal-oxide semiconductor transistorUNITED MICROELECTRONICS CORP·Filed 1998·Granted Sep 7, 1999·125 cites·20 claims
- 0592US6654841B2USB interface flash memory card reader with a built-in flash memoryPOWER QUOTIENT INTERNAT COMPAN·Filed 2001·Granted Nov 25, 2003·77 cites·4 claims
- 0692US6064107AGate structure of a semiconductor device having an air gapUNITED MICROELECTRONICS CORP·Filed 1998·Granted May 16, 2000·88 cites·10 claims
- 0791US5914519AAir-gap spacer of a metal-oxide-semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jun 22, 1999·80 cites·3 claims
- 0890US6013569AOne step salicide process without bridgingUNITED MICROELECTRONICS CORP·Filed 1997·Granted Jan 11, 2000·86 cites·31 claims
- 0987US8322766B1Wafer gripperHSIUNG WILLIAM·Filed 2011·Granted Dec 4, 2012·17 cites·10 claims
- 1087US6297082B1Method of fabricating a MOS transistor with local channel ion implantation regionsUNITED MICROELECTRONICS CORP·Filed 1999·Granted Oct 2, 2001·89 cites·11 claims
- 1186USD590283SPortion of a tape measureCOOPER BRANDS INC·Filed 2008·Granted Apr 14, 2009·26 cites·1 claims
- 1283US6605005B1Detachable laser pointer for golf putterFiled 2002·Granted Aug 12, 2003·38 cites·8 claims
- 1382US6190981B1Method for fabricating metal oxide semiconductorUNITED MICROELECTRONICS CORP·Filed 1999·Granted Feb 20, 2001·48 cites·18 claims
- 1482US5874353AMethod of forming a self-aligned silicide deviceUNITED MICROELECTRONICS CORP·Filed 1997·Granted Feb 23, 1999·52 cites·16 claims
- 1581USD579359SPortion of a tape measureCOOPER BRANDS INC·Filed 2007·Granted Oct 28, 2008·21 cites·1 claims
- 1680USD590284SPortion of a tape measureCOOPER BRANDS INC·Filed 2008·Granted Apr 14, 2009·20 cites·1 claims
- 1780US5990015ADual damascence processUNITED MICROELECTRONICS CORP·Filed 1998·Granted Nov 23, 1999·60 cites·21 claims
- 1877US6177336B1Method for fabricating a metal-oxide semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jan 23, 2001·40 cites·20 claims
- 1975US8454717B2Foldable dust collectorLIN TONY·Filed 2010·Granted Jun 4, 2013·3 cites·6 claims
- 2075US7955404B2Dust collectorLIN TONY·Filed 2009·Granted Jun 7, 2011·5 cites·5 claims
- 2175US6153478ASTI process for eliminating kink effectUNITED MICROELECTRONICS CORP·Filed 1998·Granted Nov 28, 2000·46 cites·20 claims
- 2275US6077769AMethod of fabricating a daul damascene structureUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jun 20, 2000·46 cites·26 claims
- 2374US6015746AMethod of fabricating semiconductor device with a gate-side air-gap structureUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jan 18, 2000·30 cites·24 claims
- 2473USD630392SDust collectorLIN TONY·Filed 2009·Granted Jan 4, 2011·18 cites·1 claims
- 2572US6048771AShallow trench isolation techniqueUNITED MICROELECTRONICS CORP·Filed 1998·Granted Apr 11, 2000·41 cites·19 claims
- 2671US8419845B2Air filterLIN TONY·Filed 2011·Granted Apr 16, 2013·2 cites·12 claims
- 2771US6902994B2Method for fabricating transistor having fully silicided gateUNITED MICROELECTRONICS CORP·Filed 2003·Granted Jun 7, 2005·23 cites·20 claims
- 2870US6365468B1Method for forming doped p-type gate with anti-reflection layerUNITED MICROELECTRONICS CORP·Filed 2000·Granted Apr 2, 2002·16 cites·15 claims
- 2970US6297112B1Method of forming a MOS transistorUNITED MICROELECTRONICS CORP·Filed 2000·Granted Oct 2, 2001·14 cites·5 claims
- 3070US5972763AMethod of fabricating an air-gap spacer of a metal-oxide-semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Oct 26, 1999·25 cites·8 claims
- 3170US5780348AMethod of making a self-aligned silicide componentUNITED MICROELECTRONICS CORP·Filed 1997·Granted Jul 14, 1998·31 cites·15 claims
- 3269US8096614B2Locking mechanismLIN TONY·Filed 2010·Granted Jan 17, 2012·6 cites·8 claims
- 3369US6174778B1Method of fabricating metal oxide semiconductorUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jan 16, 2001·34 cites·19 claims
- 3468US5895254AMethod of manufacturing shallow trench isolation structureUNITED MICROELECTRONICS CORP·Filed 1997·Granted Apr 20, 1999·35 cites·15 claims
- 3567US8394162B2Dust collectorLIN TONY·Filed 2011·Granted Mar 12, 2013·3 cites·8 claims
- 3667US6350656B1SEG combined with tilt side implant processUNITED MICROELECTRONICS CORP·Filed 2000·Granted Feb 26, 2002·13 cites·18 claims
- 3767US6316303B1Method of fabricating a MOS transistor having SEG siliconUNITED MICROELECTRONICS CORP·Filed 2000·Granted Nov 13, 2001·13 cites·15 claims
- 3867US6015753AMethod of forming a self-aligned silicideUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jan 18, 2000·26 cites·13 claims
- 3967US5981383AMethod of fabricating a salicide layer of a device electrodeUNITED MICROELECTRONICS CORP·Filed 1997·Granted Nov 9, 1999·32 cites·17 claims
- 4065USD434464SHubLIN TONY·Filed 1999·Granted Nov 28, 2000·12 cites·1 claims
- 4164US6083783AMethod of manufacturing complementary metallic-oxide-semiconductorUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jul 4, 2000·24 cites·18 claims
- 4263US6559016B2Method of manufacturing low-leakage, high-performance deviceUNITED MICROELECTRONICS CORP·Filed 2000·Granted May 6, 2003·8 cites·18 claims
- 4363USD434463SHubLIN TONY·Filed 1999·Granted Nov 28, 2000·11 cites·1 claims
- 4462US6165857AMethod for forming a transistor with selective epitaxial growth filmUNITED MICOELECTRONICS CORP·Filed 1999·Granted Dec 26, 2000·22 cites·23 claims
- 4561US6274450B1Method for implementing metal oxide semiconductor field effect transistorUNITED MICROELECTRONICS CORP·Filed 1999·Granted Aug 14, 2001·20 cites·18 claims
- 4661US6187645B1Method for manufacturing semiconductor device capable of preventing gate-to-drain capacitance and eliminating birds beak formationUNITED MICROELECTRONICS CORP·Filed 1999·Granted Feb 13, 2001·19 cites·10 claims
- 4761US6069061AMethod for forming polysilicon gateUNITED MICROELECTRONICS CORP·Filed 1999·Granted May 30, 2000·19 cites·7 claims
- 4860US6153483AMethod for manufacturing MOS deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Nov 28, 2000·24 cites·15 claims
- 4960US6008118AMethod of fabricating a barrier layerUNITED MICROELECTRONICS CORP·Filed 1998·Granted Dec 28, 1999·25 cites·13 claims
- 5059USD660051SSupporting rack for dust collectorLIN TONY·Filed 2011·Granted May 22, 2012·10 cites·1 claims
Showing the top 50 of 106 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →