Inventor · disambiguated record
Tomonori Nakamura
Also filed as: NAKAMURA TOMONORI
113 granted patents·36 pending applications·277 citations·filing 1998–2025
99Inventor score
Files withHAMAMATSU PHOTONICS KK60SHINKAWA KK20NAKAMURA TOMONORI11SEIKO EPSON CORP10PANASONIC IP CORP AMERICA9
Top patents by PatentIndex Score
149 records- 0192US7218611B2Broadcast systemMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted May 15, 2007·52 cites·5 claims
- 0291US11024596B2Bonding apparatus and bonding methodSHINKAWA KK·Filed 2017·Granted Jun 1, 2021·7 cites·20 claims
- 0390US9114649B2Inkjet recording apparatusSEIKO EPSON CORP·Filed 2013·Granted Aug 25, 2015·4 cites·8 claims
- 0489US12072289B2Inspection apparatus comprising a first imager imaging fluorescence having a wavelength longer than a first wavelength and a second imager imaging fluorescence having a wavelength shorter than a second wavelength and inspection methodHAMAMATSU PHOTONICS KK·Filed 2020·Granted Aug 27, 2024·2 cites·17 claims
- 0589US8949884B2Broadcast receiving apparatus, broadcast receiving method, and programPANASONIC IP CORP AMERICA·Filed 2012·Granted Feb 3, 2015·10 cites·20 claims
- 0688US11694324B2Inspection apparatus and inspection methodHAMAMATSU PHOTONICS KK·Filed 2020·Granted Jul 4, 2023·2 cites·19 claims
- 0788US9099350B2Apparatus for inspecting integrated circuitNAKAMURA TOMONORI·Filed 2012·Granted Aug 4, 2015·7 cites·7 claims
- 0887US7474621B2Broadcast systemMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2007·Granted Jan 6, 2009·9 cites·15 claims
- 0986US7902054B2Schottky barrier semiconductor device and method for manufacturing the sameCENTRAL RES INST ELECT·Filed 2007·Granted Mar 8, 2011·13 cites·2 claims
- 1085US12013349B2Inspection apparatus and inspection methodHAMAMATSU PHOTONICS KK·Filed 2020·Granted Jun 18, 2024·1 cites·9 claims
- 1185US10330615B2Analysis system and analysis methodHAMAMATSU PHOTONICS KK·Filed 2014·Granted Jun 25, 2019·4 cites·12 claims
- 1285US9588175B2Semiconductor device inspection device and semiconductor device inspection methodHAMAMATSU PHOTONICS KK·Filed 2013·Granted Mar 7, 2017·4 cites·12 claims
- 1385US7507650B2Process for producing Schottky junction type semiconductor deviceCENTRAL RES INST ELECT·Filed 2005·Granted Mar 24, 2009·12 cites·7 claims
- 1485US7458663B2Pressure-regulating valve, functional liquid supplying apparatus, imaging apparatus, method of manufacturing electro-optic device, electro-optic device, and electronic apparatusSEIKO EPSON CORP·Filed 2005·Granted Dec 2, 2008·9 cites·10 claims
- 1584US11094567B2Mounting apparatus and method for manufacturing semiconductor deviceSHINKAWA KK·Filed 2018·Granted Aug 17, 2021·4 cites·18 claims
- 1683US10978420B2Semiconductor chip mounting apparatus and semiconductor chip mounting methodSHINKAWA KK·Filed 2018·Granted Apr 13, 2021·4 cites·20 claims
- 1783US10277544B2Information processing apparatus which cooperate with other apparatus, and method for controlling the sameCANON KK·Filed 2014·Granted Apr 30, 2019·6 cites·19 claims
- 1883US9156289B2Recording deviceSEIKO EPSON CORP·Filed 2014·Granted Oct 13, 2015·2 cites·6 claims
- 1983US8503869B2Stereoscopic video playback device and stereoscopic video display deviceNAKAMURA TOMONORI·Filed 2009·Granted Aug 6, 2013·8 cites·7 claims
- 2081US12405228B2Inspection apparatus and inspection methodHAMAMATSU PHOTONICS KK·Filed 2024·Granted Sep 2, 2025·0 cites·11 claims
- 2180US9562944B2Semiconductor device inspection device and semiconductor device inspection methodHAMAMATSU PHOTONICS KK·Filed 2014·Granted Feb 7, 2017·3 cites·25 claims
- 2280US8154026B2Silicon carbide bipolar semiconductor deviceISHII RYOSUKE·Filed 2006·Granted Apr 10, 2012·8 cites·20 claims
- 2379US9738146B2Weather strip for automobilesNISHIKAWA RUBBER CO LTD·Filed 2016·Granted Aug 22, 2017·5 cites·9 claims
- 2477US9618550B2Apparatus for frequency analyzing a measurement target and method of frequency analyzing a measurement targetHAMAMATSU PHOTONICS KK·Filed 2014·Granted Apr 11, 2017·3 cites·18 claims
- 2577US9618576B2Apparatus for testing a semiconductor device and method of testing a semiconductor deviceHAMAMATSU PHOTONICS KK·Filed 2014·Granted Apr 11, 2017·3 cites·18 claims
- 2677US8827409B2Recording apparatusSEIKO EPSON CORP·Filed 2013·Granted Sep 9, 2014·2 cites·10 claims
- 2776US11296048B2Semiconductor chip mounting device and method for manufacturing semiconductor deviceSHINKAWA KK·Filed 2017·Granted Apr 5, 2022·2 cites·6 claims
- 2876US10185534B2Control method, controller, and recording mediumPANASONIC IP CORP AMERICA·Filed 2016·Granted Jan 22, 2019·3 cites·20 claims
- 2976US9618563B2Semiconductor device inspection device and semiconductor device inspection methodHAMAMATSU PHOTONICS KK·Filed 2014·Granted Apr 11, 2017·2 cites·12 claims
- 3076US2024361244A1Inspection apparatus and inspection methodHAMAMATSU PHOTONICS KK·Filed 2024·Application pending·0 cites
- 3175US11512411B2PTFE sheet and method for mounting dieSHINKAWA KK·Filed 2018·Granted Nov 29, 2022·2 cites·6 claims
- 3275US9825773B2Device control by speech commands with microphone and camera to acquire line-of-sight informationPANASONIC IP CORP AMERICA·Filed 2016·Granted Nov 21, 2017·3 cites·19 claims
- 3374US11189594B2Bonding apparatus and bonding methodSHINKAWA KK·Filed 2018·Granted Nov 30, 2021·2 cites·9 claims
- 3474US7960737B2Silicon carbide semiconductor device and manufacturing method thereforKANSAI ELECTRIC POWER CO·Filed 2010·Granted Jun 14, 2011·2 cites·1 claims
- 3573US12467740B2Imaging unit and measurement deviceHAMAMATSU PHOTONICS KK·Filed 2021·Granted Nov 11, 2025·0 cites·7 claims
- 3673US8937310B2Detection method for semiconductor integrated circuit device, and semiconductor integrated circuit deviceNAKAMURA TOMONORI·Filed 2011·Granted Jan 20, 2015·3 cites·14 claims
- 3770US12467739B2Height measurement apparatus and height measurement methodHAMAMATSU PHOTONICS KK·Filed 2021·Granted Nov 11, 2025·0 cites·8 claims
- 3869US10063386B2Control method, controller, and recording mediumPANASONIC IP CORP AMERICA·Filed 2016·Granted Aug 28, 2018·1 cites·13 claims
- 3969US7880873B2Droplet discharge deviceSEIKO EPSON CORP·Filed 2008·Granted Feb 1, 2011·2 cites·7 claims
- 4068US10976284B2Inspection device and inspection methodHAMAMATSU PHOTONICS KK·Filed 2019·Granted Apr 13, 2021·0 cites·7 claims
- 4168US10698006B2Inspection method and inspection apparatusHAMAMATSU PHOTONICS KK·Filed 2016·Granted Jun 30, 2020·1 cites·14 claims
- 4268US7960257B2Silicon carbide semiconductor device and manufacturing method thereforKANSAI ELECTRIC POWER CO·Filed 2010·Granted Jun 14, 2011·1 cites·3 claims
- 4368US7960738B2Silicon carbide semiconductor device and manufacturing method thereforKANSAI ELECTRIC POWER CO·Filed 2010·Granted Jun 14, 2011·1 cites·1 claims
- 4467US10591427B2Analysis system and analysis methodHAMAMATSU PHOTONICS KK·Filed 2019·Granted Mar 17, 2020·0 cites·8 claims
- 4567US2025155374A1Inspection apparatus and inspection methodHAMAMATSU PHOTONICS KK·Filed 2025·Application pending·0 cites
- 4667US2020241275A1Optical device for microscopic observationHAMAMATSU PHOTONICS KK·Filed 2020·Application pending·0 cites
- 4766US11009531B2Image generating method, image generating device, image generating program, and storage mediumHAMAMATSU PHOTONICS KK·Filed 2020·Granted May 18, 2021·0 cites·13 claims
- 4866US10705139B2Semiconductor device inspection device and semiconductor device inspection methodHAMAMATSU PHOTONICS KK·Filed 2018·Granted Jul 7, 2020·0 cites·13 claims
- 4966US9538375B2Method for configuring wireless connection settings, wireless communications apparatus, and display methodPANASONIC IP CORP AMERICA·Filed 2014·Granted Jan 3, 2017·2 cites·17 claims
- 5066US7768017B2Silicon carbide semiconductor device and manufacturing method thereforKANSAI ELECTRIC CO INC·Filed 2004·Granted Aug 3, 2010·9 cites·5 claims
Showing the top 50 of 149 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →