Inventor · disambiguated record
Toshiyuki Nakao
Also filed as: KATO KIKUO · NAKAO TOSHIYUKI
42 granted patents·8 pending applications·752 citations·filing 1977–2020
98Inventor score
Top patents by PatentIndex Score
50 records- 0196US7710557B2Surface defect inspection method and apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted May 4, 2010·24 cites·7 claims
- 0295US8035808B2Surface defect inspection method and apparatusHITACHI HIGH TECH CORP·Filed 2010·Granted Oct 11, 2011·14 cites·17 claims
- 0395US5359569ASemiconductor memoryHITACHI LTD·Filed 1992·Granted Oct 25, 1994·236 cites·14 claims
- 0493US5515333ASemiconductor memoryHITACHI LTD·Filed 1994·Granted May 7, 1996·181 cites·3 claims
- 0592US8310665B2Inspecting method and inspecting apparatus for substrate surfaceHAMAMATSU AKIRA·Filed 2012·Granted Nov 13, 2012·9 cites·18 claims
- 0692US8144337B2Inspecting method and inspecting apparatus for substrate surfaceHAMAMATSU AKIRA·Filed 2009·Granted Mar 27, 2012·15 cites·15 claims
- 0792US4653352AAutomatic transmission system for automobiles having hydraulic and electronic control systemsAISIN SEIKI·Filed 1984·Granted Mar 31, 1987·71 cites·2 claims
- 0890US7869024B2Method and its apparatus for inspecting defectsHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 11, 2011·11 cites·13 claims
- 0989US7675613B2Defect inspection methodHITACHI HIGH TECH CORP·Filed 2009·Granted Mar 9, 2010·9 cites·8 claims
- 1087US8314929B2Method and its apparatus for inspecting defectsURANO YUTA·Filed 2011·Granted Nov 20, 2012·5 cites·6 claims
- 1187US7719673B2Defect inspecting device for sample surface and defect detection method thereforHITACHI HIGH TECH CORP·Filed 2007·Granted May 18, 2010·10 cites·15 claims
- 1286US8599369B2Defect inspection device and inspection methodURANO YUTA·Filed 2010·Granted Dec 3, 2013·6 cites·15 claims
- 1386US7916288B2Defect inspection methodHITACHI HIGH TECH CORP·Filed 2010·Granted Mar 29, 2011·4 cites·12 claims
- 1483US8670116B2Method and device for inspecting for defectsNAKAO TOSHIYUKI·Filed 2011·Granted Mar 11, 2014·6 cites·16 claims
- 1581US8804110B2Fault inspection device and fault inspection methodURANO YUTA·Filed 2011·Granted Aug 12, 2014·4 cites·8 claims
- 1681US8638429B2Defect inspecting method and defect inspecting apparatusNAKAO TOSHIYUKI·Filed 2009·Granted Jan 28, 2014·5 cites·16 claims
- 1780US8654350B2Inspecting method and inspecting apparatus for substrate surfaceHAMAMATSU AKIRA·Filed 2012·Granted Feb 18, 2014·2 cites·10 claims
- 1879US8514388B2Flaw inspecting method and device thereforMARUYAMA SHIGENOBU·Filed 2010·Granted Aug 20, 2013·5 cites·3 claims
- 1979US8482727B2Defect inspection methodNAKAO TOSHIYUKI·Filed 2012·Granted Jul 9, 2013·2 cites·13 claims
- 2079US8115915B2Defect inspection method and apparatusNAKAO TOSHIYUKI·Filed 2011·Granted Feb 14, 2012·2 cites·13 claims
- 2179US7965386B2Method and its apparatus for inspecting defectsHITACHI HIGH TECH CORP·Filed 2010·Granted Jun 21, 2011·2 cites·7 claims
- 2278US10254235B2Defect inspecting method and defect inspecting apparatusHITACHI HIGH TECH CORP·Filed 2017·Granted Apr 9, 2019·1 cites·5 claims
- 2378US8264679B2Inspection apparatusOSHIMA YOSHIMASA·Filed 2012·Granted Sep 11, 2012·2 cites·18 claims
- 2475US8477302B2Defect inspection apparatusURANO YUTA·Filed 2009·Granted Jul 2, 2013·4 cites·18 claims
- 2574US8711347B2Defect inspection method and device thereforHONDA TOSHIFUMI·Filed 2011·Granted Apr 29, 2014·2 cites·16 claims
- 2674US4138906APower distributing apparatus for vehiclesAISIN SEIKI·Filed 1977·Granted Feb 13, 1979·23 cites·7 claims
- 2772US7216360B2Device management system, management client, controller server, method for managing usage context of device, and recording medium which records the methodRICOH KK·Filed 2001·Granted May 8, 2007·26 cites·8 claims
- 2869US8120766B2Inspection apparatusOSHIMA YOSHIMASA·Filed 2009·Granted Feb 21, 2012·1 cites·17 claims
- 2966US4188838AControl apparatus of a transfer mechanismAISIN SEIKI·Filed 1977·Granted Feb 19, 1980·17 cites·4 claims
- 3065US9506872B2Inspection apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 29, 2016·0 cites·19 claims
- 3164US4954122ADifferential gear apparatus with worm gearsAISIN SEIKI·Filed 1989·Granted Sep 4, 1990·18 cites·2 claims
- 3264US4821946ASoldering methodHITACHI LTD·Filed 1987·Granted Apr 18, 1989·22 cites·8 claims
- 3364US2014176943A1Surface defect inspection method and apparatusHITACHI HIGH TECH CORP·Filed 2014·Application pending·0 cites
- 3463US12043916B2Quartz glass crucible with crystallization-accelerator-containing layer having gradient concentrationSUMCO CORP·Filed 2020·Granted Jul 23, 2024·0 cites·8 claims
- 3562US8934092B2Surface defect inspection method and apparatusOSHIMA YOSHIMASA·Filed 2013·Granted Jan 13, 2015·0 cites·14 claims
- 3660US8705026B2Inspection apparatusOSHIMA YOSHIMASA·Filed 2012·Granted Apr 22, 2014·0 cites·26 claims
- 3759US9228960B2Defect inspecting method and defect inspecting apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 5, 2016·0 cites·16 claims
- 3858US9841384B2Defect inspecting method and defect inspecting apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 12, 2017·0 cites·19 claims
- 3958US8400629B2Surface defect inspection method and apparatusOSHIMA YOSHIMASA·Filed 2011·Granted Mar 19, 2013·0 cites·15 claims
- 4052US4878400ABias ratio levelling apparatus of a worm gear type differentialAISIN SEIKI·Filed 1988·Granted Nov 7, 1989·13 cites·6 claims
- 4150US2010225904A1Defect Inspection Tool For Sample Surface And Defect Detection Method ThereforOSHIMA YOSHIMASA·Filed 2010·Application pending·0 cites
- 4249US8958062B2Defect inspection method and device using sameSHIBATA YUKIHIRO·Filed 2011·Granted Feb 17, 2015·0 cites·13 claims
- 4345US9041921B2Defect inspection device and defect inspection methodNAKAO TOSHIYUKI·Filed 2011·Granted May 26, 2015·0 cites·6 claims
- 4444US10352879B2X-ray inspection method and deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jul 16, 2019·0 cites·15 claims
- 4542US2011242524A1Flat surface inspection apparatusHITACHI LTD·Filed 2011·Application pending·0 cites
- 4639US2006016285A1Shift operating apparatus for a vehicleAISIN AI CO LTD·Filed 2005·Application pending·0 cites
- 4738US2018209924A1Defect Determining Method and X-Ray Inspection DeviceHITACHI HIGH TECH CORP·Filed 2015·Application pending·0 cites
- 4838US2005273863A1Device management system, management client, controller server, method for managing usage context of device, and recording medium which records the methodRICOH KK·Filed 2005·Application pending·0 cites
- 4937US2012092656A1Defect Inspection Method and Defect Inspection ApparatusNAKAO TOSHIYUKI·Filed 2010·Application pending·0 cites
- 5035US2016211112A1Method and Apparatus for Reviewing DefectsHITACHI HIGH TECH CORP·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →