Inventor · disambiguated record
Toshihiro Ohno
Also filed as: OHNO TOSHIHIRO
1 granted patent·1 pending application·0 citations·filing 2015–2024
5Inventor score
Files withTOKYO ELECTRON LTD2
Top patents by PatentIndex Score
2 records- 0157US2024420359A1Profile detecting method and profile detecting apparatusTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 0225US10128121B2Substrate processing apparatus, substrate processing method and substrate processing programTOKYO ELECTRON LTD·Filed 2015·Granted Nov 13, 2018·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →