Inventor · disambiguated record
Toshiyuki Okayasu
Also filed as: OKAYASU TOSHIYUKI
118 granted patents·10 pending applications·1,176 citations·filing 1994–2012
99Inventor score
Top patents by PatentIndex Score
128 records- 0194US7679391B2Test equipment and semiconductor deviceADVANTEST CORP·Filed 2008·Granted Mar 16, 2010·27 cites·17 claims
- 0290US6157200AIntegrated circuit device testerADVANTEST CORP·Filed 1997·Granted Dec 5, 2000·83 cites·13 claims
- 0389US8378700B2Wafer unit for testing semiconductor chips and test systemADVANTEST CORP·Filed 2010·Granted Feb 19, 2013·8 cites·7 claims
- 0488US8471754B2Time measurement circuitYAMAMOTO KAZUHIRO·Filed 2009·Granted Jun 25, 2013·17 cites·16 claims
- 0587US5712582ATest signal generator having timing calibration circuitADVANTEST CORP·Filed 1996·Granted Jan 27, 1998·59 cites·7 claims
- 0686US6420921B1Delay signal generating apparatus and semiconductor test apparatusADVANTEST CORP·Filed 2000·Granted Jul 16, 2002·42 cites·16 claims
- 0786US6257771B1Opitcal/electrical hybrid wiring board and its manufacturing methodADVANTEST CORP·Filed 1997·Granted Jul 10, 2001·78 cites·18 claims
- 0884US7126366B2Semiconductor test apparatusADVANTEST CORP·Filed 2003·Granted Oct 24, 2006·30 cites·8 claims
- 0984US6586924B1Method for correcting timing for IC tester and IC tester having correcting function using the correcting methodADVANTEST CORP·Filed 2000·Granted Jul 1, 2003·38 cites·18 claims
- 1083US7642797B2Power supply stabilizing circuit, an electronic device and a test apparatusADVANTEST CORP·Filed 2008·Granted Jan 5, 2010·11 cites·13 claims
- 1183US5491673ATiming signal generation circuitADVANTEST CORP·Filed 1994·Granted Feb 13, 1996·38 cites·7 claims
- 1282US7071746B2Variable delay circuitADVANTEST CORP·Filed 2004·Granted Jul 4, 2006·22 cites·6 claims
- 1381US6549052B2Variable delay circuitADVANTEST CORP·Filed 2001·Granted Apr 15, 2003·20 cites·14 claims
- 1480US6469514B2Timing calibration apparatus and method in a semiconductor integrated circuit testerADVANTEST CORP·Filed 2001·Granted Oct 22, 2002·24 cites·9 claims
- 1579US7812595B2Electronic device identifying methodUNIV TOHOKU NAT UNIV CORP·Filed 2008·Granted Oct 12, 2010·7 cites·8 claims
- 1679US6597753B1Delay clock generating apparatus and delay time measuring apparatusADVANTEST CORP·Filed 2000·Granted Jul 22, 2003·22 cites·14 claims
- 1778US8269569B2Test apparatus for digital modulated signalWATANABE DAISUKE·Filed 2009·Granted Sep 18, 2012·6 cites·12 claims
- 1877US7848828B2Method and apparatus for managing manufacturing equipment, method for manufacturing device therebyUNIV TOHOKU NAT UNIV CORP·Filed 2008·Granted Dec 7, 2010·5 cites·22 claims
- 1977US6433567B1CMOS integrated circuit and timing signal generator using sameADVANTEST CORP·Filed 2000·Granted Aug 13, 2002·20 cites·7 claims
- 2076US8466701B2Power supply stabilizing circuit, electronic device and test apparatusKOJIMA SHOJI·Filed 2010·Granted Jun 18, 2013·4 cites·19 claims
- 2176US8301411B2Electronic device, host apparatus, communication system, and recording mediumOKAYASU TOSHIYUKI·Filed 2010·Granted Oct 30, 2012·4 cites·28 claims
- 2275US8159290B2Test apparatus, demodulation apparatus, test method, demodulation method and electric deviceYAMAMOTO KAZUHIRO·Filed 2010·Granted Apr 17, 2012·4 cites·24 claims
- 2375US7286742B2Test apparatus and cable guide unitFURUKAWA ELECTRIC CO LTD·Filed 2006·Granted Oct 23, 2007·6 cites·11 claims
- 2475US6842061B2Timing generating apparatus and test apparatusADVANTEST CORP·Filed 2004·Granted Jan 11, 2005·17 cites·14 claims
- 2575US5764598ADelay time measurement apparatus for delay circuitADVANTEST CORP·Filed 1996·Granted Jun 9, 1998·37 cites·20 claims
- 2674US7756654B2Test apparatusADVANTEST CORP·Filed 2007·Granted Jul 13, 2010·7 cites·15 claims
- 2774US7502980B2Signal generator, test apparatus, and circuit deviceADVANTEST CORP·Filed 2006·Granted Mar 10, 2009·3 cites·10 claims
- 2874US6285692B1Method and apparatus for driving laser diodeADVANTEST CORP·Filed 1999·Granted Sep 4, 2001·37 cites·16 claims
- 2973US8754631B2Test apparatus for digital modulated signalWATANABE DAISUKE·Filed 2008·Granted Jun 17, 2014·5 cites·11 claims
- 3073US7316578B2Electronic device test apparatus with optical cablesADVANTEST CORP·Filed 2006·Granted Jan 8, 2008·4 cites·19 claims
- 3173US6940330B2Timing generator, semiconductor test apparatus, and timing generating methodADVANTEST CORP·Filed 2004·Granted Sep 6, 2005·15 cites·13 claims
- 3273US5898326ASignal transmission cable driver apparatus without a peaking coilADVANTEST CORP·Filed 1997·Granted Apr 27, 1999·45 cites·9 claims
- 3372US8896332B2Test apparatus with voltage margin testISHIDA MASAHIRO·Filed 2011·Granted Nov 25, 2014·2 cites·19 claims
- 3472US8390268B2Noise measurement apparatus and test apparatusOKAYASU TOSHIYUKI·Filed 2009·Granted Mar 5, 2013·6 cites·14 claims
- 3572US8278961B2Test apparatus and test methodWATANABE DAISUKE·Filed 2009·Granted Oct 2, 2012·6 cites·15 claims
- 3672US7847572B2Test system, electronic device, and test apparatusADVANTEST CORP·Filed 2008·Granted Dec 7, 2010·6 cites·7 claims
- 3772US7332926B2Semiconductor test apparatusADVANTEST CORP·Filed 2006·Granted Feb 19, 2008·6 cites·2 claims
- 3871US8239147B2Test apparatus and manufacturing methodWATANABE DAISUKE·Filed 2009·Granted Aug 7, 2012·2 cites·7 claims
- 3971US7911242B2Signal generating apparatus, test apparatus and circuit deviceADVANTEST CORP·Filed 2009·Granted Mar 22, 2011·2 cites·17 claims
- 4070US8466702B2Test system and substrate unit for testingWATANABE DAISUKE·Filed 2010·Granted Jun 18, 2013·2 cites·11 claims
- 4170US6967516B2Semiconductor testing apparatus with a variable delay circuitADVANTEST CORP·Filed 2003·Granted Nov 22, 2005·12 cites·10 claims
- 4269US8139953B2Signal transmission device, signal reception device, test module, and semiconductor chipOKAYASU TOSHIYUKI·Filed 2008·Granted Mar 20, 2012·4 cites·20 claims
- 4369US6944835B2Delay circuit, testing apparatus, and capacitorADVANTEST CORP·Filed 2003·Granted Sep 13, 2005·11 cites·8 claims
- 4469US6822267B1Signal transmission circuit, CMOS semiconductor device, and circuit boardADVANTEST CORP·Filed 2001·Granted Nov 23, 2004·11 cites·9 claims
- 4568US8436604B2Measuring apparatus, parallel measuring apparatus, testing apparatus and electronic deviceYAMAMOTO KAZUHIRO·Filed 2010·Granted May 7, 2013·2 cites·28 claims
- 4668US8375340B2Apparatus for manufacturing substrate for testing, method for manufacturing substrate for testing and recording mediumADVANTEST CORP·Filed 2010·Granted Feb 12, 2013·2 cites·16 claims
- 4768US8093918B2Electronic device identifying method and electronic device comprising identification meansOKAYASU TOSHIYUKI·Filed 2010·Granted Jan 10, 2012·2 cites·6 claims
- 4868US7034723B2Timing comparator, data sampling apparatus, and testing apparatusADVANTEST CORP·Filed 2004·Granted Apr 25, 2006·16 cites·10 claims
- 4968US6598212B2Delay circuit, testing apparatus, and capacitorADVANTEST CORP·Filed 2001·Granted Jul 22, 2003·11 cites·1 claims
- 5067US8502549B2Test apparatus and driver circuitKOJIMA SHOJI·Filed 2010·Granted Aug 6, 2013·2 cites·30 claims
Showing the top 50 of 128 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →