Inventor · disambiguated record
Toshiyuki Sameshima
Also filed as: SAMESHIMA TOSHIYUKI
21 granted patents·4 pending applications·1,328 citations·filing 1991–2015
96Inventor score
Files withSONY CORP15SAMESHIMA TOSHIYUKI2UNIV TOKYO NAT UNIV CORP2CITIZEN WATCH CO LTD1HIGHTEC SYSTEMS CORP1
Top patents by PatentIndex Score
25 records- 0198US5304250APlasma system comprising hollow mesh plate electrodeSONY CORP·Filed 1992·Granted Apr 19, 1994·219 cites·13 claims
- 0296US6713235B1Method for fabricating thin-film substrate and thin-film substrate fabricated by the methodCITIZEN WATCH CO LTD·Filed 2000·Granted Mar 30, 2004·128 cites·19 claims
- 0396US5145808AMethod of crystallizing a semiconductor thin filmSONY CORP·Filed 1991·Granted Sep 8, 1992·294 cites·3 claims
- 0494US5648276AMethod and apparatus for fabricating a thin film semiconductor deviceSONY CORP·Filed 1994·Granted Jul 15, 1997·274 cites·3 claims
- 0591US6339010B2Semiconductor element forming process having a step of separating film structure from substratePRESIDENT OF TOKYO UNIVERSITY·Filed 1998·Granted Jan 15, 2002·137 cites·8 claims
- 0689US5608231AField effect transistor having channel with plural quantum boxes arranged in a common planeSONY CORP·Filed 1996·Granted Mar 4, 1997·79 cites·8 claims
- 0776US6458715B2Process of manufacturing semiconductor deviceSONY CORP·Filed 2001·Granted Oct 1, 2002·15 cites·1 claims
- 0876US5910015AThin film transistor and manufacturing method of the thin film transistorSONY CORP·Filed 1998·Granted Jun 8, 1999·28 cites·15 claims
- 0970US5591653AMethod of manufacturing Si-Ge thin film transistorSONY CORP·Filed 1995·Granted Jan 7, 1997·41 cites·5 claims
- 1069US5726487ASemiconductor device having an improved thin film transistorSONY CORP·Filed 1994·Granted Mar 10, 1998·20 cites·6 claims
- 1161US6291366B1Process of manufacturing semiconductor devicesSONY CORP·Filed 1995·Granted Sep 18, 2001·22 cites·9 claims
- 1259US5446304AInsulated-gate-type field effect transistor which has subgates that have different spacing from the substrate than the main gateSONY CORP·Filed 1994·Granted Aug 29, 1995·19 cites·1 claims
- 1356US2014144495A1Solar cell and method for manufacturing the sameUNIV TOKYO NAT UNIV CORP·Filed 2012·Application pending·0 cites
- 1455US5889292ASemiconductor device having an improved thin film transistorSONY CORP·Filed 1995·Granted Mar 30, 1999·12 cites·18 claims
- 1552US5561088AHeating method and manufacturing method for semiconductor deviceSONY CORP·Filed 1995·Granted Oct 1, 1996·13 cites·13 claims
- 1651US5894159ASemiconductor device having first and second insulating layersSONY CORP·Filed 1997·Granted Apr 13, 1999·13 cites·7 claims
- 1748US9595909B2Storage type solar power generation device and storage type solar power generation systemNAT UNIV CORP TOKYO UNIV AGRICULTURE & TECH·Filed 2014·Granted Mar 14, 2017·0 cites·6 claims
- 1846US5804454AInsulation film-forming method for semiconductor device manufacturing wherein SiOx (O≦x≦1.8) is evaporatedSONY CORP·Filed 1995·Granted Sep 8, 1998·10 cites·6 claims
- 1945US2009253273A1Method of heat-treating semiconductorHIGHTEC SYSTEMS CORP·Filed 2007·Application pending·0 cites
- 2041US10126253B2Photoinduced carrier lifetime measurement device and photoinduced carrier lifetime measurement methodNATIONAL UNIV CORPORATION TOKYO UNIV OF AGRICULTURE AND TECHNOLOGY·Filed 2012·Granted Nov 13, 2018·0 cites·12 claims
- 2136US2001022387A1Pattern forming method for semiconductor manufacturingFiled 2001·Application pending·0 cites
- 2235US8258043B2Manufacturing method of thin film semiconductor substrateSAMESHIMA TOSHIYUKI·Filed 2011·Granted Sep 4, 2012·0 cites·9 claims
- 2333US2016172522A1Multi-junction solar cell and method for manufacturing thereofUNIV TOKYO NAT UNIV CORP·Filed 2015·Application pending·0 cites
- 2432US9239299B2Photoinduced carrier lifetime measuring method, light incidence efficiency measuring method, photoinduced carrier lifetime measuring device, and light incidence efficiency measuring deviceSAMESHIMA TOSHIYUKI·Filed 2010·Granted Jan 19, 2016·0 cites·11 claims
- 2530US5431126AMethod of forming semiconductor crystal and semiconductor deviceSONY CORP·Filed 1993·Granted Jul 11, 1995·4 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →