Inventor · disambiguated record
Toshinaga Takeya
Also filed as: TAKEYA TOSHINAGA
8 granted patents·1 pending application·15 citations·filing 2009–2023
79Inventor score
Top patents by PatentIndex Score
9 records- 0190US11971296B2Measurement system and measurement methodNIHON MICRONICS KK·Filed 2021·Granted Apr 30, 2024·2 cites·15 claims
- 0288US11624679B2Optical probe, optical probe array, test system and test methodNIHON MICRONICS KK·Filed 2020·Granted Apr 11, 2023·2 cites·9 claims
- 0370US8063651B2Contact for electrical test of electronic devices, probe assembly and method for manufacturing the sameKAMATA SHOJI·Filed 2009·Granted Nov 22, 2011·5 cites·9 claims
- 0467US9015935B2Method for manufacturing probe cardTAKEYA TOSHINAGA·Filed 2011·Granted Apr 28, 2015·4 cites·10 claims
- 0559US9015934B2Method for manufacturing probe cardTAKEYA TOSHINAGA·Filed 2011·Granted Apr 28, 2015·2 cites·7 claims
- 0652US2025116685A1Probe storage jig, probe storage system, and probe storage methodNIHON MICRONICS KK·Filed 2022·Application pending·0 cites
- 0749US12379398B2Measurement systemNIHON MICRONICS KK·Filed 2021·Granted Aug 5, 2025·0 cites·7 claims
- 0834USD1087034SElectric contactNIHON MICRONICS KK·Filed 2023·Granted Aug 5, 2025·0 cites·1 claims
- 0934USD1086075SElectric contactNIHON MICRONICS KK·Filed 2023·Granted Jul 29, 2025·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →