Inventor · disambiguated record
Tohru Tsujide
Also filed as: TSUJIDE TOHRU
23 granted patents·757 citations·filing 1979–2008
97Inventor score
Top patents by PatentIndex Score
23 records- 0197US6768324B1Semiconductor device tester which measures information related to a structure of a sample in a depth directionFAB SOLUTIONS INC·Filed 2000·Granted Jul 27, 2004·141 cites·35 claims
- 0295US7385195B2Semiconductor device testerTOPCON CORP·Filed 2005·Granted Jun 10, 2008·25 cites·13 claims
- 0392US5532610AApparatus for testing semicondctor waferNEC CORP·Filed 1994·Granted Jul 2, 1996·100 cites·12 claims
- 0491US6559662B1Semiconductor device tester and semiconductor device test methodFAB SOLUTIONS INC·Filed 2000·Granted May 6, 2003·59 cites·31 claims
- 0590US6133744AApparatus for testing semiconductor waferNEC CORP·Filed 1996·Granted Oct 17, 2000·100 cites·9 claims
- 0687US4310900AMemory device with different read and write power levelsNIPPON ELECTRIC CO·Filed 1979·Granted Jan 12, 1982·29 cites·15 claims
- 0786US6946857B2Semiconductor device testerFAB SOLUTIONS INC·Filed 2004·Granted Sep 20, 2005·25 cites·25 claims
- 0886US6614244B2Semiconductor device inspecting apparatusFAB SOLUTIONS INC·Filed 2001·Granted Sep 2, 2003·35 cites·13 claims
- 0985US4322736AShort-resistant connection of polysilicon to diffusionNIPPON ELECTRIC CO·Filed 1979·Granted Mar 30, 1982·59 cites·8 claims
- 1082US6975125B2Semiconductor device testerFAB SOLUTIONS INC·Filed 2004·Granted Dec 13, 2005·19 cites·42 claims
- 1178US4481524ASemiconductor memory device having stacked polycrystalline silicon layersNIPPON ELECTRIC CO·Filed 1982·Granted Nov 6, 1984·41 cites·15 claims
- 1276US7321805B2Production managing system of semiconductor deviceFAB SOLUTIONS INC·Filed 2004·Granted Jan 22, 2008·14 cites·38 claims
- 1370US7795593B2Surface contamination analyzer for semiconductor wafersTOPCON CORP·Filed 2008·Granted Sep 14, 2010·2 cites·18 claims
- 1470US7700380B2Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor deviceTOPCON CORP·Filed 2005·Granted Apr 20, 2010·2 cites·13 claims
- 1569US6711453B2Production managing system of semiconductor deviceFAB SOLUTIONS INC·Filed 2002·Granted Mar 23, 2004·10 cites·17 claims
- 1668US6943043B2Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor deviceFAB SOLUTIONS INC·Filed 2004·Granted Sep 13, 2005·8 cites·21 claims
- 1767US4590508AMOS static ram with capacitively loaded gates to prevent alpha soft errorsNIPPON ELECTRIC CO·Filed 1983·Granted May 20, 1986·29 cites·14 claims
- 1860US6842663B2Production managing system of semiconductor deviceFAB SOLUTIONS INC·Filed 2004·Granted Jan 11, 2005·5 cites·11 claims
- 1959US6753194B2Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor deviceFAB SOLUTIONS INC·Filed 2002·Granted Jun 22, 2004·5 cites·6 claims
- 2054US4733285ASemiconductor device with input and/or output protective circuitNEC CORP·Filed 1985·Granted Mar 22, 1988·16 cites·11 claims
- 2149US5521516ASemiconductor integrated circuit fault analyzing apparatus and method thereforNEC CORP·Filed 1994·Granted May 28, 1996·14 cites·20 claims
- 2237US5703492ASystem and method for fault analysis of semiconductor integrated circuitNEC CORP·Filed 1995·Granted Dec 30, 1997·10 cites·21 claims
- 2337US5511162AAutomatic LSI testing apparatus using expert systemNEC CORP·Filed 1993·Granted Apr 23, 1996·9 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →