Inventor · disambiguated record
Tomá{Hacek Over (S)} Tůma
Also filed as: TŮMA TOMÁ{HACEK OVER (S)}
4 granted patents·3 citations·filing 2020–2021
59Inventor score
Files withFEI CO4
Top patents by PatentIndex Score
4 records- 0178US11519871B2Method of examining a sample using a charged particle microscopeFEI CO·Filed 2020·Granted Dec 6, 2022·2 cites·18 claims
- 0274US11327032B2Method of examining a sample using a charged particle microscopeFEI CO·Filed 2020·Granted May 10, 2022·1 cites·18 claims
- 0353US11703468B2Method and system for determining sample composition from spectral dataFEI CO·Filed 2021·Granted Jul 18, 2023·0 cites·24 claims
- 0446US11971372B2Method of examining a sample using a charged particle microscopeFEI CO·Filed 2020·Granted Apr 30, 2024·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →