Inventor · disambiguated record
Tomá{Hacek Over (S)} Vystav{Hacek Over (E)}L
Also filed as: VYSTAV{HACEK OVER (E)}L TOMÁ{HACEK OVER (S)}
12 granted patents·19 citations·filing 2013–2021
84Inventor score
Files withFEI CO12
Top patents by PatentIndex Score
12 records- 0187US9618463B2Method of acquiring EBSP patternsFEI CO·Filed 2015·Granted Apr 11, 2017·9 cites·20 claims
- 0281US10784076B23D defect characterization of crystalline samples in a scanning type electron microscopeFEI CO·Filed 2018·Granted Sep 22, 2020·4 cites·19 claims
- 0380US11815479B2Method of examining a sample using a charged particle beam apparatusFEI CO·Filed 2021·Granted Nov 14, 2023·1 cites·13 claims
- 0476US10504689B2Method for sample orientation for TEM lamella preparationFEI CO·Filed 2017·Granted Dec 10, 2019·3 cites·20 claims
- 0566US10170275B2Cryogenic specimen processing in a charged particle microscopeFEI CO·Filed 2017·Granted Jan 1, 2019·1 cites·20 claims
- 0658US12002194B2Training an artificial neural network using simulated specimen imagesFEI CO·Filed 2020·Granted Jun 4, 2024·0 cites·18 claims
- 0758US9762863B2Method of sampling a sample and displaying obtained informationFEI CO·Filed 2013·Granted Sep 12, 2017·1 cites·20 claims
- 0856US11195693B1Method and system for dynamic band contrast imagingFEI CO·Filed 2020·Granted Dec 7, 2021·0 cites·18 claims
- 0947US11499926B2Method for diffraction pattern acquisitionFEI CO·Filed 2020·Granted Nov 15, 2022·0 cites·18 claims
- 1047US10846845B2Training an artificial neural network using simulated specimen imagesFEI CO·Filed 2018·Granted Nov 24, 2020·0 cites·20 claims
- 1139US9958403B1Arrangement for X-Ray tomographyFEI CO·Filed 2017·Granted May 1, 2018·0 cites·20 claims
- 1236US11017980B2Method of manipulating a sample in an evacuated chamber of a charged particle apparatusFEI CO·Filed 2016·Granted May 25, 2021·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →