Inventor · disambiguated record
Tomas Vystavel
Also filed as: VYSTAVEL TOMAS · VYSTAVEL TOMÁŠ · VYSTAVĚL TOMÁŠ
10 granted patents·2 pending applications·34 citations·filing 2015–2025
85Inventor score
Files withFEI CO12
Top patents by PatentIndex Score
12 records- 0192US11513079B2Method and system for wafer defect inspectionFEI CO·Filed 2020·Granted Nov 29, 2022·4 cites·19 claims
- 0289US9837246B1Reinforced sample for transmission electron microscopeFEI CO·Filed 2016·Granted Dec 5, 2017·16 cites·23 claims
- 0387US11650171B2Offcut angle determination using electron channeling patternsFEI CO·Filed 2021·Granted May 16, 2023·2 cites·19 claims
- 0485US10978272B2Measurement and endpointing of sample thicknessFEI CO·Filed 2019·Granted Apr 13, 2021·5 cites·18 claims
- 0580US11476079B1Method and system for imaging a multi-pillar sampleFEI CO·Filed 2021·Granted Oct 18, 2022·2 cites·22 claims
- 0673US9741527B2Specimen holder for a charged particle microscopeFEI CO·Filed 2015·Granted Aug 22, 2017·3 cites·20 claims
- 0770US10629409B2Specimen preparation and inspection in a dual-beam charged particle microscopeFEI CO·Filed 2018·Granted Apr 21, 2020·2 cites·20 claims
- 0855US12211666B2Data acquisition and processing techniques for three-dimensional reconstructionFEI CO·Filed 2021·Granted Jan 28, 2025·0 cites·17 claims
- 0954US12106931B2Systems and methods for pre-aligning samples for more efficient processing of multiple samples with a Broad Ion Beam (BIB) systemFEI CO·Filed 2022·Granted Oct 1, 2024·0 cites·20 claims
- 1053US2025112022A1Methods and systems of electron diffractionFEI CO·Filed 2024·Application pending·0 cites
- 1152US2025231130A1Improved scanning electron microscope and method of using the sameFEI CO·Filed 2025·Application pending·0 cites
- 1236US10105734B2Method of modifying a sample surface layer from a microscopic sampleFEI CO·Filed 2016·Granted Oct 23, 2018·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →