Inventor · disambiguated record
Toshio Yabe
Also filed as: YABE TOSHIO
2 granted patents·21 citations·filing 1997–2008
52Inventor score
Top patents by PatentIndex Score
2 records- 0152US6111246ASemiconductor device testing apparatus having presence or absence detectors issuing an alarm when an error occursADVANTEST CORP·Filed 1997·Granted Aug 29, 2000·21 cites·31 claims
- 0237US8175738B2Device manufacturing apparatus and device manufacturing methodYABE TOSHIO·Filed 2008·Granted May 8, 2012·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →