Inventor · disambiguated record
Tsunehiro Sakai
Also filed as: SAKAI TSUNEHIRO
5 granted patents·2 pending applications·24 citations·filing 2009–2014
75Inventor score
Top patents by PatentIndex Score
7 records- 0188US8595666B2Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying programHAYAKAWA KOICHI·Filed 2010·Granted Nov 26, 2013·10 cites·24 claims
- 0277US8995748B2Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying methodSAKAI TSUNEHIRO·Filed 2010·Granted Mar 31, 2015·7 cites·13 claims
- 0366US8625906B2Image classification standard update method, program, and image classification deviceISOMAE YUYA·Filed 2009·Granted Jan 7, 2014·4 cites·18 claims
- 0463US8472696B2Observation condition determination support device and observation condition determination support methodKONISHI JUNKO·Filed 2009·Granted Jun 25, 2013·3 cites·16 claims
- 0543US10141159B2Sample observation device having a selectable acceleration voltageHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 27, 2018·0 cites·13 claims
- 0636US2014177940A1Recipe generation apparatus, inspection support apparatus, inspection system, and recording mediaNAKAGAKI RYO·Filed 2011·Application pending·0 cites
- 0732US2013283227A1Pattern review tool, recipe making tool, and method of making recipeSAKAI TSUNEHIRO·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →