Inventor · disambiguated record
Tung-Sheng Chen
Also filed as: CHEN TUNG-SHENG
10 granted patents·5 pending applications·36 citations·filing 2004–2020
85Inventor score
Top patents by PatentIndex Score
15 records- 0186US8836298B1Multi-phase switching regulator and control method thereofCHEN TUNG-SHENG·Filed 2013·Granted Sep 16, 2014·10 cites·4 claims
- 0286US8263458B2Process margin engineering in charge trapping field effect transistorsCHEN TUNG-SHENG·Filed 2010·Granted Sep 11, 2012·10 cites·20 claims
- 0385US8461053B2Self-aligned NAND flash select-gate wordlines for spacer double patterningCHEN TUNG-SHENG·Filed 2010·Granted Jun 11, 2013·7 cites·15 claims
- 0484US8874253B2Self-aligned NAND flash select-gate wordlines for spacer double patterningSPANSION LLC·Filed 2013·Granted Oct 28, 2014·5 cites·15 claims
- 0574US8441063B2Memory with extended charge trapping layerFANG SHENQING·Filed 2010·Granted May 14, 2013·4 cites·12 claims
- 0666US11050207B2Crimping apparatus and system for crimping a flexible printed circuitSECURITAG ASSEMBLY GROUP CO LTD·Filed 2020·Granted Jun 29, 2021·0 cites·5 claims
- 0753US8835277B2Method to improve charge trap flash memory core cell performance and reliabilitySPANSION LLC·Filed 2012·Granted Sep 16, 2014·0 cites·21 claims
- 0853US2015035044A1Method to Improve Charge Trap Flash Memory Core Cell Performance and ReliabilitySPANSION LLC·Filed 2014·Application pending·0 cites
- 0948US2018287324A1Crimping apparatus and system for crimping a flexible printed circuitSECURITAG ASSEMBLY GROUP CO LTD·Filed 2018·Application pending·0 cites
- 1045US10014641B2Crimping apparatus and system for crimping a flexible printed circuitSECURITAG ASSEMBLY GROUP CO LTD·Filed 2015·Granted Jul 3, 2018·0 cites·11 claims
- 1144US2015255480A1Method to Improve Charge Trap Flash Memory Top Oxide QualitySPANSION LLC·Filed 2014·Application pending·0 cites
- 1243US9564331B2Apparatus and method for rounded ONO formation in a flash memory deviceFANG SHENQING·Filed 2012·Granted Feb 7, 2017·0 cites·7 claims
- 1340US2014148009A1Forming a Substantially Uniform Wing Height Among Elements in a Charge Trap Semiconductor DeviceSPANSION LLC·Filed 2012·Application pending·0 cites
- 1438US9412598B2Edge rounded field effect transistors and methods of manufacturingFANG SHENQING·Filed 2010·Granted Aug 9, 2016·0 cites·3 claims
- 1529US2005199944A1[non-volatile memory cell]Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →