Inventor · disambiguated record
Ui Suh
Also filed as: SUH UI · SUH UI W · SUH UI WON
22 granted patents·2 pending applications·303 citations·filing 1999–2008
96Inventor score
Top patents by PatentIndex Score
24 records- 0192US6570125B2Simultaneous offset dual sided laser shock peening with oblique angle laser beamsGEN ELECTRIC·Filed 2001·Granted May 27, 2003·26 cites·49 claims
- 0288US6629464B2Laser shock peening quality assurance by acoustic analysisFiled 2001·Granted Oct 7, 2003·22 cites·41 claims
- 0387US7689030B2Methods and apparatus for testing a componentGEN ELECTRIC·Filed 2005·Granted Mar 30, 2010·17 cites·17 claims
- 0487US7206706B2Inspection method and system using multifrequency phase analysisGEN ELECTRIC·Filed 2005·Granted Apr 17, 2007·18 cites·21 claims
- 0583US7518359B2Inspection of non-planar parts using multifrequency eddy current with phase analysisGEN ELECTRIC·Filed 2006·Granted Apr 14, 2009·8 cites·12 claims
- 0682US6914215B2Real time laser shock peening quality assurance by natural frequency analysisGEN ELECTRIC·Filed 2003·Granted Jul 5, 2005·22 cites·31 claims
- 0781US7948233B2Omnidirectional eddy current array probes and methods of useGEN ELECTRIC·Filed 2008·Granted May 24, 2011·7 cites·19 claims
- 0881US6422082B1Laser shock peening quality assurance by ultrasonic analysisGEN ELECTRIC·Filed 2000·Granted Jul 23, 2002·20 cites·19 claims
- 0980US6570126B2Simultaneous offset dual sided laser shock peening using low energy laser beamsGEN ELECTRIC·Filed 2001·Granted May 27, 2003·12 cites·22 claims
- 1080US6075593AMethod for monitoring and controlling laser shock peening using temporal light spectrum analysisGEN ELECTRIC·Filed 1999·Granted Jun 13, 2000·44 cites·24 claims
- 1176US7952348B2Flexible eddy current array probe and methods of assembling the sameGEN ELECTRIC·Filed 2007·Granted May 31, 2011·8 cites·14 claims
- 1276US6296448B1Simultaneous offset dual sided laser shock peeningGEN ELECTRIC·Filed 1999·Granted Oct 2, 2001·20 cites·17 claims
- 1375US8269489B2System and method for eddy current inspection of parts with complex geometriesWANG CHANGTING·Filed 2008·Granted Sep 18, 2012·6 cites·12 claims
- 1475US7337651B2Method for performing model based scanplan generation of a component under inspectionGEN ELECTRIC·Filed 2005·Granted Mar 4, 2008·6 cites·21 claims
- 1574US7657389B2Method of aligning probe for eddy current inspectionGEN ELECTRIC·Filed 2006·Granted Feb 2, 2010·7 cites·25 claims
- 1673US6907358B2Eddy current inspection methodGEN ELECTRIC·Filed 2003·Granted Jun 14, 2005·23 cites·20 claims
- 1769US7154265B2Eddy current probe and inspection methodGEN ELECTRIC·Filed 2004·Granted Dec 26, 2006·10 cites·12 claims
- 1865US7888932B2Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the sameGEN ELECTRIC·Filed 2007·Granted Feb 15, 2011·3 cites·11 claims
- 1965US7817845B2Multi-frequency image processing for inspecting parts having complex geometric shapesGEN ELECTRIC·Filed 2006·Granted Oct 19, 2010·7 cites·17 claims
- 2065US7436992B2Methods and apparatus for testing a componentGEN ELECTRIC·Filed 2004·Granted Oct 14, 2008·6 cites·20 claims
- 2157US8013599B2Methods and apparatus for testing a componentGEN ELECTRIC·Filed 2004·Granted Sep 6, 2011·2 cites·11 claims
- 2246US2011004452A1Method for compensation of responses from eddy current probesKORUKONDA SANGHAMITHRA·Filed 2007·Application pending·0 cites
- 2346US2010312494A1Process and apparatus for testing a component using an omni-directional eddy current probeKORUKONDA SANGHAMITHRA·Filed 2007·Application pending·0 cites
- 2441US6237419B1Aspherical curved element transducer to inspect a part with curved entry surfaceGEN ELECTRIC·Filed 1999·Granted May 29, 2001·9 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →