Inventor · disambiguated record
Ulrich Backhausen
Also filed as: BACKHAUSEN ULRICH
21 granted patents·4 pending applications·40 citations·filing 2010–2018
92Inventor score
Files withINFINEON TECHNOLOGIES AG14KERN THOMAS6BACKHAUSEN ULRICH2INFINEONTECHNOLOGIES AG2JEFREMOW MIHAIL1
Top patents by PatentIndex Score
25 records- 0180US9450613B2Apparatus and method for error correction and error detectionINFINEON TECHNOLOGIES AG·Filed 2014·Granted Sep 20, 2016·7 cites·25 claims
- 0278US10056145B2Resistive memory transition monitoringINFINEON TECHNOLOGIES AG·Filed 2017·Granted Aug 21, 2018·4 cites·20 claims
- 0377US10319460B2Systems and methods utilizing a flexible read reference for a dynamic read windowINFINEON TECHNOLOGIES AG·Filed 2013·Granted Jun 11, 2019·6 cites·17 claims
- 0475US9203437B2Circuitry and method for correcting 3-bit errors containing adjacent 2-bit errorKERN THOMAS·Filed 2012·Granted Dec 1, 2015·6 cites·24 claims
- 0569US10067826B2Marker programming in non-volatile memoriesINFINEON TECHNOLOGIES AG·Filed 2016·Granted Sep 4, 2018·1 cites·11 claims
- 0669US9281032B2Memory timing circuitINFINEONTECHNOLOGIES AG·Filed 2014·Granted Mar 8, 2016·3 cites·16 claims
- 0768US8559243B2Self timed current integrating scheme employing level and slope detectionJEFREMOW MIHAIL·Filed 2010·Granted Oct 15, 2013·4 cites·21 claims
- 0867US10599350B2Using a differential memory storage architecture for updating a memory areaINFINEON TECHNOLOGIES AG·Filed 2018·Granted Mar 24, 2020·2 cites·17 claims
- 0966US10200065B2Apparatus and method for correcting at least one bit error within a coded bit sequenceINFINEON TECHNOLOGIES AG·Filed 2013·Granted Feb 5, 2019·3 cites·11 claims
- 1061US8856629B2Device and method for testing a circuit to be testedKERN THOMAS·Filed 2012·Granted Oct 7, 2014·1 cites·22 claims
- 1158US8539321B2Apparatus and method for correcting at least one bit error within a coded bit sequenceKERN THOMAS·Filed 2010·Granted Sep 17, 2013·2 cites·22 claims
- 1256US9405618B2Marker programming in non-volatile memoriesINFINEON TECHNOLOGIES AG·Filed 2014·Granted Aug 2, 2016·0 cites·23 claims
- 1352US9389999B2System and method for emulating an EEPROM in a non-volatile memory deviceKERN THOMAS·Filed 2012·Granted Jul 12, 2016·1 cites·22 claims
- 1449US8966355B2Apparatus and method for comparing pairs of binary wordsKERN THOMAS·Filed 2012·Granted Feb 24, 2015·0 cites·14 claims
- 1547US10311955B2Resistive memory transition monitoringINFINEON TECHNOLOGIES AG·Filed 2018·Granted Jun 4, 2019·0 cites·19 claims
- 1643US9489994B2Memory timing circuitINFINEONTECHNOLOGIES AG·Filed 2016·Granted Nov 8, 2016·0 cites·1 claims
- 1742US2014198583A1Method and System for Reducing the Size of Nonvolatile MemoriesINFINEON TECHNOLOGIES AG·Filed 2013·Application pending·0 cites
- 1840US9343179B2Word line address scanINFINEON TECHNOLOGIES AG·Filed 2013·Granted May 17, 2016·0 cites·20 claims
- 1939US2015179270A1Method and System for Reducing the Size of Nonvolatile MemoriesINFINEON TECHNOLOGIES AG·Filed 2015·Application pending·0 cites
- 2036US9569354B2System and method to emulate an electrically erasable programmable read-only memoryINFINEON TECHNOLOGIES AG·Filed 2013·Granted Feb 14, 2017·0 cites·18 claims
- 2136US2011138249A1Apparatus and Method for Detecting an Error Within a Plurality of Coded Binary Words Coded by an Error Correction CodeINFINEON TECHNOLOGIES AG·Filed 2010·Application pending·0 cites
- 2235US2014241055A1Method and System for Reducing the Complexity of Electronically Programmable Nonvolatile MemoryINFINEON TECHNOLOGIES AG·Filed 2013·Application pending·0 cites
- 2333US8898535B2Apparatus and method for detecting an error within a coded binary wordKERN THOMAS·Filed 2010·Granted Nov 25, 2014·0 cites·24 claims
- 2433US8533566B2Method and apparatus for storing dataBACKHAUSEN ULRICH·Filed 2011·Granted Sep 10, 2013·0 cites·17 claims
- 2529US8913435B2Method and device for programming data into non-volatile memoriesBACKHAUSEN ULRICH·Filed 2011·Granted Dec 16, 2014·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →