Inventor · disambiguated record
Ulrich Baur
Also filed as: BAUR ULRICH · BAUR ULRICH W
7 granted patents·162 citations·filing 1999–2010
86Inventor score
Technology areasG01R
Top patents by PatentIndex Score
7 records- 0188US6490702B1Scan structure for improving transition fault coverage and scan diagnosticsIBM·Filed 1999·Granted Dec 3, 2002·72 cites·11 claims
- 0278US6728914B2Random path delay testing methodologyCADENCE DESIGN SYSTEMS INC·Filed 2000·Granted Apr 27, 2004·22 cites·16 claims
- 0378US6662324B1Global transition scan based AC methodIBM·Filed 2000·Granted Dec 9, 2003·22 cites·15 claims
- 0477US6816990B2VLSI chip test power reductionIBM·Filed 2002·Granted Nov 9, 2004·21 cites·12 claims
- 0567US6774656B2Self-test for leakage current of driver/receiver stagesIBM·Filed 2001·Granted Aug 10, 2004·13 cites·20 claims
- 0666US6725171B2Self-test with split, asymmetric controlled driver output stageIBM·Filed 2001·Granted Apr 20, 2004·12 cites·9 claims
- 0739US8479070B2Integrated circuit arrangement for test inputsBAUR ULRICH·Filed 2010·Granted Jul 2, 2013·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →